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AD12400JWS Datasheet(Fiches technique) 5 Page - Analog Devices

Numéro de pièce AD12400JWS
Description  12-Bit 400 MSPS A/D Converter
Télécharger  28 Pages
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
Logo AD - Analog Devices

AD12400JWS Datasheet(HTML) 5 Page - Analog Devices

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AD12400
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AD12400JWS
AD12400KWS
Parameter
Case Temp
Test Level
Min
Typ
Max
Min
Typ
Max
Unit
DR Propagation Delay (tEDR)
60C
V
3.88
3.88
ns
Data to DR Skew (tEDR ? tPD)
60C
V
2.68
2.68
ns
Pipeline Latency7
Full
IV
40
40
Cycles
Aperture Delay (tA)
60C
V
1.6
1.6
ns
Aperture Uncertainty (Jitter, tJ)
60C
V
0.4
0.4
ps rms
1 All ac specifications tested with a single-ended 2.0 V p-p ENCODE.
2 Dynamic performance guaranteed for analog input frequencies of 10 MHz to 180 MHz.
3 Not including image spur.
4 Image spur will be at fs/2?AIN and the offset spur will be at fs/2.
5 F1 = 70 MHz, F2 = 73 MHz.
6 Parts are tested with 400 MSPS encode. Device can be clocked at lower encode rates, but specifications are not guaranteed. Specifications will be guaranteed by
design for encode 400 MSPS 1%.
7Pipeline latency will be exactly 40 cycles.
EXPLANATION OF TEST LEVELS
I
100% production tested.
II
100% production tested at 25C and sample tested at specified temperatures.
III
Sample tested only.
IV
Parameter is guaranteed by design and characterization testing.
V
Parameter is a typical value only.
VI
100% production tested at 25C; guaranteed by design and characterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.


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