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ISL58327CIZ-T7A Fiches technique(PDF) 5 Page - Intersil Corporation

No de pièce ISL58327CIZ-T7A
Description  Wide Optical Spectrum Laser Power Monitor IC
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Fabricant  INTERSIL [Intersil Corporation]
Site Internet  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

ISL58327CIZ-T7A Fiches technique(HTML) 5 Page - Intersil Corporation

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ISL58327
5
FN6577.2
July 29, 2013
Sensitivity V
DD = 5.0V, TA = +25°C unless otherwise specified.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
(Note 6)
TYP
MAX
(Note 6)
UNIT
Gain00
TIA Lowest Gain
(445nm)
0dB fine gain adjustment, 7FFh Differential output
350
450
550
mV/µA
Gain01
TIA 2nd Lowest Gain
(445nm)
0dB fine gain adjustment, 7FFh Differential output
700
890
1100
mV/µA
Gain10
TIA 2nd Highest Gain
(445nm)
0dB fine gain adjustment, 7FFh Differential output
1400
1790
2170
mV/µA
Gain11
TIA Highest Gain
(445nm)
0dB fine gain adjustment, 7FFh Differential output
3700
4850
6020
mV/µA
GainFine_MAX
Maximum Fine Gain
for both HIGH Gain and LOW Gain channels
Compared to 0dB fine gain setting, 7FFh
19
dB
GainFine_MIN
Minimum Fine Gain
for both HIGH Gain and LOW Gain channels
Compared to 0dB fine gain setting, 7FFh
-5.5
dB
Current to Optical conversion: Optical sensitivity is not tested in production. Gain parameters were obtained using input test currents. The
following factors are used to convert current to optical power.
I2O450nm
Current to Optical conversion
(450 nm)
Bench data; measured on typical devices
0.27
µA/µW
I2O530nm
Current to Optical conversion
(530 nm)
Bench data; measured on typical devices
0.26
µA/µW
I2O640nm
Current to Optical conversion
(640 nm)
Bench data; measured on typical devices
0.38
µA/µW
Serial Interface AC Performance V
DD = 5.0V, TA = +25°C unless otherwise specified.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
(Note 6)
TYP
MAX
(Note 6)
UNIT
Ci
Input Capacitance
10
pF
fSCL
SCL Clock Frequency
400
kHz
INPUTLEAKGE
Input Leakage SCL and SDA pin
-20
20
µA
NOTE:
6. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.


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