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SCAN16512 Fiches technique(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No de pièce SCAN16512
Description  Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
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Fabricant  NSC [National Semiconductor (TI)]
Site Internet  http://www.national.com
Logo NSC - National Semiconductor (TI)

SCAN16512 Fiches technique(HTML) 1 Page - National Semiconductor (TI)

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SCAN16512
Low Voltage Universal 16-bit IEEE 1149.1 Bus
Transceiver with TRI-STATE Outputs
General Description
The SCAN16512 is a high speed, low-power universal bus
transceiver featuring data inputs organized into two 8-bit
bytes with output enable and latch enable control signals.
This function is configurable as a D-type Latch or Flip-Flop,
and can operate in transparent, latched, or clocked mode.
This device is compliant with IEEE 1149.1 Standard Test
Access Port and Boundary Scan Architecture with the incor-
poration of the defined boundary-scan test logic and test
access port consisting of Test Data Input (TDI), Test Data
Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and
Test Reset (TRST).
Features
n
IEEE 1149.1 (JTAG) Compliant
n
2.7V to 3.6V V
CC Operation
n
TRI-STATE outputs for bus-oriented applications
n
Dual byte-wide data for bus applications
n
Power down high Impedance inputs and outputs
n
Optional Bus Hold on data inputs eliminates the need
for external pullup/pulldown resistors (SCANH16512,
SCANH162512 versions)
n
Optional 25
Ω series resistors in outputs to minimize
noise and eliminate termination resistors (SCAN162512,
SCANH162512 versions)
n
Supports live insertion/withdrawal
n
Includes CLAMP and HIGHZ instructions
Block Diagram
20026602
August 2002
© 2002 National Semiconductor Corporation
DS200266
www.national.com


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Numéro de composants électroniques

No de pièceDescriptionHtml ViewFabricant
SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE-R Outputs 1  2  3  4  5  More National Semiconductor (TI)
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