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K6F3216T6M Fiches technique(PDF) 6 Page - Samsung semiconductor |
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K6F3216T6M Fiches technique(HTML) 6 Page - Samsung semiconductor |
6 / 9 page K6F3216T6M Family Revision 1.0 November 2002 6 CMOS SRAM Address Data Out Previous Data Valid Data Valid TIMING DIAGRAMS TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1=OE=VIL, CS2=WE=VIH, UB or/and LB=VIL) TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH) Data Valid High-Z tRC CS1 Address UB, LB OE Data out tAA tRC tOH tOH tAA tCO tBA tOE tOLZ tBLZ tLZ tOHZ tBHZ tHZ NOTES (READ CYCLE) 1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device interconnection. CS2 |
Numéro de pièce similaire - K6F3216T6M |
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Description similaire - K6F3216T6M |
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