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FCD4B14CC Fiches technique(PDF) 11 Page - ATMEL Corporation |
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FCD4B14CC Fiches technique(HTML) 11 Page - ATMEL Corporation |
11 / 20 page 11 FCD4B14 1962C–01/02 Figure 6. FCD4B14 Block Diagram Functional Description The circuit is divided into two main sections: sensor and data conversion. One particular column among 280+1 is selected in the sensor array (1), then each pixel of the selected column sends its electrical information to amplifiers (2) (one per line), then two lines at a time are selected (odd and even) so that two particular pixels send their information to the input of two 4-bit Analog-to-Digital Converters (3), so 2 pixels can be read for each clock pulse (4). Figure 7. Functional Description Sensor Each pixel is a sensor in itself. The sensor detects a temperature differential between the beginning of acquisition and the reading of information: this is the integration time. The integration time begins with a reset of the pixel to a predefined initial state. Note that the integration time reset has nothing to do with the reset of the digital section. Then, at a rate depending on the sensitivity of the pyroelectric layer, on the temperature variation between the reset and the end of the integration time, and on the duration of the integration time, electrical charges are generated at the pixel level. 2240 8 latches chip temperature sensor line sel odd even 8 lines of 280 columns of pixels 4-bit ADC ADC 8 1 dummy column 4 4 amp chip temperature stabilization ACKN De0-3 Do0-3 output enable analog output OE AVE AVO TPE TPP 1 8 PCLK RST clock reset column selection 4-bit 8 latches chip temperature sensor column selection line sel odd even 8 lines of 280 columns of pixels 4-bit ADC ADC 8 1 dummy column 4 4 amp De0-3 Do0-3 1 2 3 4 4-bit |
Numéro de pièce similaire - FCD4B14CC |
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Description similaire - FCD4B14CC |
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