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LM148MD8 Fiches technique(PDF) 3 Page - Texas Instruments

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No de pièce LM148MD8
Description  Quad 741 Op Amps
Download  20 Pages
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

LM148MD8 Fiches technique(HTML) 3 Page - Texas Instruments

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LM148QML
www.ti.com
SNOSAH3A – FEBRUARY 2005 – REVISED MARCH 2013
Absolute Maximum Ratings
(1)
Supply Voltage
±22V
Differential Input Voltage
±44V
Output Short Circuit Duration(2)
Continuous
Power Dissipation (Pd at 25°C)
(3)
1100mW
Thermal Resistance
θJA
CDIP (Still Air)
103°C/W
CDIP (500LF/ Min Air flow)
52°C/W
LCCC (Still Air)
90°C/W
LCCC (500LF/ Min Air flow)
66°C/W
θJC
CDIP
19°C/W
LCCC
21°C/W
Maximum Junction Temperature (TjMAX)
150°C
Operating Temperature Range
−55°C ≤ TA ≤ +125°C
Storage Temperature Range
−65°C ≤ TA ≤ +150°C
Lead Temperature (Soldering, 10 sec.) Ceramic
300°C
ESD tolerance(4)
500V
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
Any of the amplifier outputs can be shorted to ground indefinitely; however, more than one should not be simultaneously shorted as the
maximum junction temperature will be exceeded.
(3)
The maximum power dissipation for these devices must be derated at elevated temperatures and is dicated by TJMAX, θJA, and the
ambient temperature, TA. The maximum available power dissipation at any temperature is Pd = (TJMAX − TA)/θJA or the number given in
the Absolute Maximum Ratings, whichever is less.
(4)
Human body model, 1.5 k
Ω in series with 100 pF
Quality Conformance Inspection
MIL-STD-883, Method 5005 — Group A
Subgroup
Description
Temp ( °C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
Copyright © 2005–2013, Texas Instruments Incorporated
Submit Documentation Feedback
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