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LM148MD8 Fiches technique(PDF) 3 Page - Texas Instruments |
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LM148MD8 Fiches technique(HTML) 3 Page - Texas Instruments |
3 / 20 page LM148QML www.ti.com SNOSAH3A – FEBRUARY 2005 – REVISED MARCH 2013 Absolute Maximum Ratings (1) Supply Voltage ±22V Differential Input Voltage ±44V Output Short Circuit Duration(2) Continuous Power Dissipation (Pd at 25°C) (3) 1100mW Thermal Resistance θJA CDIP (Still Air) 103°C/W CDIP (500LF/ Min Air flow) 52°C/W LCCC (Still Air) 90°C/W LCCC (500LF/ Min Air flow) 66°C/W θJC CDIP 19°C/W LCCC 21°C/W Maximum Junction Temperature (TjMAX) 150°C Operating Temperature Range −55°C ≤ TA ≤ +125°C Storage Temperature Range −65°C ≤ TA ≤ +150°C Lead Temperature (Soldering, 10 sec.) Ceramic 300°C ESD tolerance(4) 500V (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) Any of the amplifier outputs can be shorted to ground indefinitely; however, more than one should not be simultaneously shorted as the maximum junction temperature will be exceeded. (3) The maximum power dissipation for these devices must be derated at elevated temperatures and is dicated by TJMAX, θJA, and the ambient temperature, TA. The maximum available power dissipation at any temperature is Pd = (TJMAX − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is less. (4) Human body model, 1.5 k Ω in series with 100 pF Quality Conformance Inspection MIL-STD-883, Method 5005 — Group A Subgroup Description Temp ( °C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM148QML |
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