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74F632VC Fiches technique(PDF) 7 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No de pièce 74F632VC
Description  32-Bit Parallel Error Detection and Correction Circuit
Download  14 Pages
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Fabricant  NSC [National Semiconductor (TI)]
Site Internet  http://www.national.com
Logo NSC - National Semiconductor (TI)

74F632VC Fiches technique(HTML) 7 Page - National Semiconductor (TI)

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Functional Description (Continued)
TABLE VI Read-Modify-Write Function
Memory
EDAC
Control
DB Output
CB
Error Flags
Cycle
Function
S1
S0
BYTEn
OEBn
Latch
Check IO
Control
ERR
MERR
LEDBO
OECB
Read
Read
Flag
H
L
Input
H
X
Input
H
Enabled
Read
Latch Input
Latched
Latched
Data
H
H
Input
H
L
Input
H
Enabled
Check Bits
Data
Check Word
Read
Latch Corrected
Latched
High Z
H
Data Word into
HH
Output
HH
Output
L
Enabled
Output Latch
Data
Syndrome
Word
Bits
Modify
Modify
Input
Write
Appropriate
Modified
H
Byte or Bytes
LL
BYTE0
H
Output
LH
H
Generate New
Output
Check Word
Check Word
Unchanged
L
BYTE0
OEB0 controls DB0–DB7 (BYTE0) OEB1 controls DB8–DB15 (BYTE1) OEB2 controls DB16–DB23 (BYTE2) OEB3 controls DB24–DB31 (BYTE3)
TABLE VII Diagnostic Function
EDAC
Control
DB Byte
DB Output
CB
Error Flags
Function
S1
S0
Data IO
Control
Latch
Check IO
Control
ERR
MERR
OEBn
LEDBO
OECB
Read
Flag
HL
Input Correct
HX
Input Correct
HH
Data Word
Check Bits
Latch Input Check
Word while Data
Input
Latched
Input Latch
L
H
Diagnostic
H
L
Input
H
Enabled
Remains
Data Word
Check Bits
Transparent
Latch Diagnostic
Input
Output
Data Word into
L
H
Diagnostic
H
H
Latched
L
Output Latch
Data Word
Check Bits
Enabled
High Z
H
Latch Diagnostic
Latched
Output
Data Word into
HH
Input
HH
Syndrome
L
Enabled
Input Latch
Diagnostic
Bits
Data Word
High Z
H
Output Diagnostic
Output
Output
Data Word
H
H
Diagnostic
L
H
Syndrome
L
Enabled
Syndrome Bits
Data Word
Bits
High Z
H
Output Corrected
Output
Output
Diagnostic Data
HH
Corrected
LL
Syndrome
L
Enabled
Word
Output
Diagnostic
Bits
Syndrome Bits
Data Word
High Z
H
Diagnostic data is a data word with an error in one bit location except when testing the MERR error flag In this casethe diagnostic data word will contain errors in
two bit locations
7


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