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54ACT11030 Fiches technique(PDF) 1 Page - Texas Instruments

No de pièce 54ACT11030
Description  8-INPUT POSITIVE-NAND GATES
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

54ACT11030 Fiches technique(HTML) 1 Page - Texas Instruments

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54ACT11030, 74ACT11030
8-INPUT POSITIVE-NAND GATES
SCLS050 – MARCH 1987 – REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
© 1993, Texas Instruments Incorporated
2–1
Inputs Are TTL-Voltage Compatible
Flow-Through Architecture Optimizes
PCB Layout
Center-Pin V
CC and GND Configurations
Minimize High-Speed Switching Noise
EPIC™ (Enhanced-Performance Implanted
CMOS) 1-
µm Process
500-mA Typical Latch-Up Immunity
at 125
°C
Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
description
These devices contain a single 8-input NAND gate
and perform the following Boolean functions in
positive logic:
Y = A
• B • C • D • E • F • G • H or
Y = A + B + C + D + E + F + G + H
The 54ACT11030 is characterized for operation
over the full military temperature range of – 55
°C
to 125
°C. The 74ACT11030 is characterized for
operation from – 40
°C to 85°C.
FUNCTION TABLE
INPUTS
A THRU H
OUTPUT
Y
All inputs H
L
One or more inputs L
H
logic symbol
logic diagram (positive logic)
&
3
A
2
B
1
C
14
D
13
E
12
F
9
G
8
H
Y
5
Y
5
3
A
2
B
1
C
14
D
13
E
12
F
9
G
8
H
† This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
54ACT11030 ...J PACKAGE
74ACT11030 ...D OR N PACKAGE
(TOP VIEW)
54ACT11030 . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
1
2
3
4
5
6
7
14
13
12
11
10
9
8
C
B
A
GND
Y
NC
NC
D
E
F
VCC
NC
G
H
3
2
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
G
NC
H
NC
NC
D
NC
C
NC
B
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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