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74ACT11010N Datasheet(Fiches technique) 1 Page - Texas Instruments

Numéro de pièce 74ACT11010N
Description  TRIPLE 3-INPUT POSITIVE-NAND GATES
Télécharger  5 Pages
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
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54ACT11010, 74ACT11010
TRIPLE 3INPUT POSITIVENAND GATES
SCAS018A − D2957, JULY 1987 − REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77001
Copyright
1993, Texas Instruments Incorporated
2−1
Inputs Are TTL-Voltage Compatible
Flow-Through Architecture to Optimize
PCB Layout
Center-Pin V
CC and GND Configurations
Minimize High-Speed Switching Noise
EPICt (Enhanced-Performance Implanted
CMOS) 1-
mm Process
500-mA Typical Latch-Up Immunity
at 125
°C
Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
description
These devices contain three independent 3-input
NAND gates. They perform the Boolean functions
Y = A
SBSC or Y = A + B + C in positive logic.
The 54ACT11010 is characterized for operation
over the full military temperature range of − 55
°C
to 125
°C. The 74ACT11010 is characterized for
operation from − 40
°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
OUTPUT
Y
H
H
H
L
L
XX
H
X
LX
H
X
X
L
H
logic symbol
7
8
9
10
11
14
15
16
1
3C
3B
3A
2C
2B
2A
1C
1B
1A
3Y
2Y
1Y
6
3
2
&
† This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
54ACT11010 . . . J PACKAGE
74ACT11010 ...D OR N PACKAGE
logic diagram (positive logic)
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1A
1Y
2Y
GND
GND
3Y
3C
3B
1B
1C
2A
VCC
VCC
2B
2C
3A
(TOP VIEW)
32
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
2C
3A
NC
3B
3C
1C
1B
NC
1A
1Y
54ACT11010 . . . FK PACKAGE
(TOP VIEW)
NC − No internal connection
1Y
1A
1B
2Y
1C
2A
2B
2C
3Y
3A
3B
3C
2
3
6
1
16
15
14
11
10
9
8
7
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
EPIC is a trademark of Texas Instruments Incorporated.




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