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SN74AHC1G14DCKRE4 Fiches technique(PDF) 4 Page - Texas Instruments |
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SN74AHC1G14DCKRE4 Fiches technique(HTML) 4 Page - Texas Instruments |
4 / 23 page SN74AHC1G14 SCLS321Q – MARCH 1996 – REVISED SEPTEMBER 2015 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VCC Supply voltage –0.5 7 V VI Input voltage(2) –0.5 7 V VO Output voltage(2) –0.5 VCC + 0.5 V IIK Input clamp current VI < 0 –20 mA IOK Output clamp current VO < 0 or VO > VCC ±20 mA IO Continuous output current VO = 0 to VCC ±25 mA Continuous current through VCC or GND ±50 mA Tj Maximum junction temperature 150 °C Tstg Storage temperature –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 6.2 ESD Ratings VALUE UNIT Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±1500 Electrostatic V(ESD) V discharge Charged-device model (CDM), per JEDEC specification JESD22-C101, all pins(2) ±1000 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VCC Supply voltage 2 5.5 V VI Input voltage 0 5.5 V VO Output voltage 0 VCC V VCC = 2 V –50 µA IOH High-level output current VCC = 3.3 V ± 0.3 V –4 mA VCC = 5 V ± 0.5 V –8 VCC = 2 V 50 µA IOL Low-level output current VCC = 3.3 V ± 0.3 V 4 mA VCC = 5 V ± 0.5 V 8 TA Operating free-air temperature –40 125 °C (1) All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, SCBA004. 4 Submit Documentation Feedback Copyright © 1996–2015, Texas Instruments Incorporated Product Folder Links: SN74AHC1G14 |
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