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DAC7563TDGSR Fiches technique(PDF) 6 Page - Texas Instruments |
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DAC7563TDGSR Fiches technique(HTML) 6 Page - Texas Instruments |
6 / 60 page DAC7562T, DAC7563T, DAC8162T DAC8163T, DAC8562T, DAC8563T SLASE61A – SEPTEMBER 2015 – REVISED OCTOBER 2015 www.ti.com 7.5 Electrical Characteristics At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT STATIC PERFORMANCE(1) Resolution 12 Bits DAC756xT Relative accuracy Using line passing through codes 32 and 4,064 ±0.3 ±0.75 LSB Differential nonlinearity 12-bit monotonic ±0.05 ±0.25 Resolution 14 Bits DAC816xT Relative accuracy Using line passing through codes 128 and 16,256 ±1 ±3 LSB Differential nonlinearity 14-bit monotonic ±0.1 ±0.5 Resolution 16 Bits DAC856xT Relative accuracy Using line passing through codes 512 and 65,024 ±4 ±12 LSB Differential nonlinearity 16-bit monotonic ±0.2 ±1 Offset error Extrapolated from two-point line(1), unloaded ±1 ±4 mV Offset error drift ±2 µV/°C Full-scale error DAC register loaded with all 1s, DAC output unloaded ±0.03 ±0.2 % FSR Zero-code error DAC register loaded with all 0s, DAC output unloaded 1 4 mV Zero-code error drift ±2 µV/°C Gain error Extrapolated from two-point line(1), unloaded ±0.01 ±0.15 % FSR ppm Gain temperature coefficient ±1 FSR/°C OUTPUT CHARACTERISTICS(2) Output voltage range 0 AVDD V DACs unloaded 7 Output voltage settling time(3) µs RL = 1 MΩ 10 Slew rate Measured between 20%–80% of a full-scale transition 0.75 V/µs RL = ∞ 1 Capacitive load stability nF RL = 2 kΩ 3 Code-change glitch impulse 1-LSB change around major carry 0.1 nV-s Digital feedthrough SCLK toggling, SYNC high 0.1 nV-s Power-on glitch impulse RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V 40 mV Full-scale swing on adjacent channel, 5 External reference Channel-to-channel dc crosstalk µV Full-scale swing on adjacent channel, 15 Internal reference DC output impedance At mid-scale input 5 Ω DAC outputs at full-scale, DAC outputs shorted to Short-circuit current 40 mA GND Power-up time, including settling time Coming out of power-down mode 50 µs AC PERFORMANCE(2) DAC output noise density TA = 25°C, at mid-scale input, fOUT = 1 kHz 90 nV/ √Hz DAC output noise TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz 2.6 µVPP LOGIC INPUTS(2) Input-pin leakage current –1 ±0.1 1 µA Logic input LOW voltage VIL 0 0.8 V Logic input HIGH voltage VIH 2.1 AVDD V Pin capacitance 3 pF (1) 16-bit: codes 512 and 65,024; 14-bit: codes 128 and 16,256; 12-bit: codes 32 and 4,064, All digital inputs kept at same IO levels before and after write to the DAC (2) Specification based on design or characterization (3) Transition time between 1 / 4 scale and 3 / 4 scale, including settling to within ±0.024% FSR 6 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: DAC7562T DAC7563T DAC8162T DAC8163T DAC8562T DAC8563T |
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