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54ABT573 Fiches technique(PDF) 3 Page - National Semiconductor (TI) |
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54ABT573 Fiches technique(HTML) 3 Page - National Semiconductor (TI) |
3 / 12 page Absolute Maximum Ratings (Note 1) Storage Temperature −65˚C to +150˚C Ambient Temperature under Bias −55˚C to +125˚C Junction Temperature under Bias Ceramic −55˚C to +175˚C V CC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Any Output in the Disabled or Power-Off State −0.5V to +5.5V in the HIGH State −0.5V to V CC Current Applied to Output in LOW State (Max) Twice the rated I OL (mA) DC Latchup Source Current −500 mA Over Voltage Latchup (I/O) 10V Recommended Operating Conditions Free Air Ambient Temperature Military −55˚C to +125˚C Supply Voltage Military +4.5V to +5.5V Minimum Input Edge Rate ( ∆V/∆t) Data Input 50 mV/ns Enable Input 20 mV/ns Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol Parameter ABT573 Units VCC Conditions Min Typ Max VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA VOH Output HIGH Voltage 54ABT 2.5 V Min IOH = −3 mA 54ABT 2.0 IOH = −24 mA VOL Output LOW Voltage 54ABT 0.55 V Min IOL = 48 mA IIH Input HIGH Current 5 µA Max VIN = 2.7V (Note 4) 5VIN = VCC IBVI Input HIGH Current 7 µA Max VIN = 7.0V Breakdown Test IIL Input LOW Current −5 µA Max VIN = 0.5V (Note 4) −5 VIN = 0.0V VID Input Leakage Test 4.75 V 0.0 IID = 1.9 µA All Other Pins Grounded IOZH Output Leakage Current 50 µA 0 − 5.5V VOUT = 2.7V; OE = 2.0V IOZL Output Leakage Current −50 µA 0 − 5.5V VOUT = 0.5V; OE = 2.0V IOS Output Short-Circuit Current −100 −275 mA Max VOUT = 0.0V ICEX Output High Leakage Current 50 µA Max VOUT = VCC IZZ Bus Drainage Test 100 µA 0.0 VOUT = 5.5V; All Others GND ICCH Power Supply Current 50 µA Max All Outputs HIGH ICCL Power Supply Current 30 mA Max All Outputs LOW ICCZ Power Supply Current 50 µA Max OE = VCC All Others at VCC or GND ICCT Additional ICC/Input Outputs Enabled 2.5 mA VI = VCC − 2.1V Outputs TRI-STATE 2.5 mA Max Enable Input VI = VCC − 2.1V Outputs TRI-STATE 2.5 mA Data Input VI = VCC − 2.1V All Others at VCC or GND ICCD Dynamic ICC No Load mA/ Max Outputs Open (Note 4) 0.12 MHz OE = GND, LE = VCC (Note 3) One Bit Toggling, 50% Duty Cycle Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz. Note 4: Guaranteed but not tested. 3 www.national.com |
Numéro de pièce similaire - 54ABT573 |
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Description similaire - 54ABT573 |
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