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LM321 Fiches technique(PDF) 2 Page - ON Semiconductor |
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LM321 Fiches technique(HTML) 2 Page - ON Semiconductor |
2 / 10 page LM321 www.onsemi.com 2 Table 1. ABSOLUTE MAXIMUM RATINGS (Over operating free-air temperature, unless otherwise stated) Parameter Rating Unit Supply Voltage 36 V INPUT AND OUTPUT PINS Input Voltage VEE – 0.3 to 32 V Input Current ±10 mA Output Short Circuit Duration (Note 1) Continuous TEMPERATURE Operating Temperature –40 to +125 °C Storage Temperature –65 to +150 °C Junction Temperature –65 to +150 °C ESD RATINGS (Note 2) Human Body Model (HBM) 200 V Charged Device Model (CDM) 800 V Machine Model (MM) 100 V OTHER RATINGS Latch-Up Current (Note 3) 100 mA MSL Level 1 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Short circuits can cause excessive heating and eventual destruction. 2. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per JEDEC standard: JESD22−A114 ESD Machine Model tested per JEDEC standard: JESD22−A115 3. Latch-up Current tested per JEDEC standard: JESD78 Table 2. THERMAL INFORMATION (Note 4) Parameter Symbol Package Value Unit Junction to Ambient qJA TSOP−5/SOT23−5 235 °C/W 4. As mounted on an 80 × 80 × 1.5 mm FR4 PCB with 650 mm2 and 2 oz (0.034 mm) thick copper heat spreader. Following JEDEC JESD/EIA 51.1, 51.2, 51.3 test guidelines. Table 3. RECOMMENDED OPERATING CONDITIONS Parameter Symbol Range Unit Supply Voltage (VCC − VEE) VS 3 to 32 V Specified Operating Range TA −40 to 85 °C Common Mode Input Voltage Range VCM VEE to VCC−1.7 V Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. |
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