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LB1946 Fiches technique(PDF) 1 Page - ON Semiconductor

No de pièce LB1946
Description  PWM Current Control Stepping Motor Driver
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Fabricant  ONSEMI [ON Semiconductor]
Site Internet  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

LB1946 Fiches technique(HTML) 1 Page - ON Semiconductor

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11707 SY IM B8-5416 No.7115-1/16
http://onsemi.com
Semiconductor Components Industries, LLC, 2013
June, 2013
LB1946
Overview
The LB1946 is stepping motor drive IC that implements PWM current control bipolar drive with a fixed off time. This
IC features 15-current setting levels using a fixed VREF voltage and supports for microstepping drive from 1-2 phase
excitation to 4W1-2 phase excitation drive. This device is optimal for driving stepping motors such as those used for
carriage drive and paper feed in printers.
Applications
• PWM current control stepping motor drivers
Features
• PWM current control with a fixed off time
• Logic input serial-parallel converter (allows 1-2, W1-2, 2W1-2, and 4W1-2 phase excitation drive)
• Current attenuation switching function (with slow decay, fast decay, and mixed decay modes)
• Built-in upper and lower side output diodes
• Simultaneous on state prevention function (through current prevention)
• Noise canceller function
• Thermal shutdown circuit
• Shutoff on low logic system voltage circuit
• Low-power mode control pin
Specifications
Absolute Maximum Ratings at Ta = 25
°C
Parameter
Symbol
Conditions
Ratings
Unit
Motor supply voltage
VBB
50
V
Peak output current
IO PEAK
tw
≤20μs
1.75
A
Maximum continuous output current
IO max
1.5
A
Logic system supply voltage
VCC
7.0
V
Logic input voltage range
VIN
-0.3 to VCC
V
Emitter output voltage
VE
1.0
V
Operating temperature
Topr
-20 to +85
°C
Storage temperature
Tstg
-55 to +150
°C
Allowable power dissipation (IC internal)
Pd max
Ta=25
°C, independent IC
3.0
W
Ordering number : EN7115
Monolithic Digital IC
PWM Current Control Stepping Motor Driver
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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