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LC74731W, LC74732W

Specifications

Maximum Ratings at Ta = 25°C

Parameter

Symbol

Conditions

Ratings

Unit

min

max

Supply voltage

V

Input voltage

All input pins

V

Output voltage

SYNCJDG, BLANK, CHARA, SEPOUT, A0 to A17,

V

CE, and OE

Allowable power dissipation

Pdmax

—

275

mW

Operating temperature

Topr

–30

+70

°C

Storage temperature

Tstg

–40

+125

°C

Parameter

Symbol

Conditions

Ratings

Unit

min

typ

max

Supply voltage

4.5

5.0

5.5

V

4.5

5.0

6.5

V

Supply voltage

2.7

5.0

5.5

V

[Only for RGB output]

2.7

5.0

6.5

V

CS, SIN, SCLK, SEPIN, and MUTE

—

5.5

V

High-level input voltage

RST

—

V

CTRL1 and OUTMOD

—

V

D0 to D7

—

5.5

V

RST, CS, SIN, SCLK, SEPIN, and MUTE

—

V

Low-level input voltage

CTRL1 and OUTMOD

—

V

D0 to D7

—

V

Pull-up resistor

RST, CS, SIN, SCLK, and MUTE (when the pull-up

25

50

90

k

Ω

resistor option is specified)

Composite video signal input

CVIN and CVCR

—

2.0

—

Vp-p

voltage

SYNIN

1.5

2.0

2.5

Vp-p

Input voltage

XtalIN (when an external clock input is used)

—

—

5.0

Vp-p

fin = 2 fsc, 4 fsc

The XtalIN and XtalOUT oscillator pins (2 fsc: NTSC)

7.159

MHz

The XtalIN and XtalOUT oscillator pins (4 fsc: NTSC)

14.318

MHz

Oscillator frequency

The XtalIN and XtalOUT oscillator pins (2 fsc: PAL)

—

8.867

—

MHz

The XtalIN and XtalOUT oscillator pins (4 fsc: PAL)

—

17.734

—

MHz

The OSCin and OSCout oscillator pins (LC oscillator)

—

10

—

MHz

Recommended Operating Conditions

Note: If the Xtalin pin is used in clock input mode, applications must take adequate input noise prevention and reduction measures.

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,

damage may occur and reliability may be affected.

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended

Operating Ranges limits may affect device reliability.