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LC717A10PJ Fiches technique(PDF) 6 Page - ON Semiconductor

No de pièce LC717A10PJ
Description  Capacitance-Digital-Converter LSI
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LC717A10PJ Fiches technique(HTML) 6 Page - ON Semiconductor

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LC717A10PJ
No.A2214-6/14
Dynamic offset calibration function to correct Cin offset drift
When measurement data at a certain channel are consecutively within the execution range of dynamic offset
calibration (4 to touch threshold, or -128 to -4) for the period of time corresponding to a value, dynamic offset
calibration is performed and the reference value at the channel is gradually corrected to 0.
The figure below shows the operation when the measured value began to drift in the positive
direction from the central value gradually.
The examples of setting to 8 times the dynamic offset calibration carried count.
CinX Threshold
4
0
Execution Range of
Dynamic Offset Calibration
(Positive range)
t
123
45678
0
0
= 0x01
Dynamic Offset Calibration
Execution Count Number
(Positive range)
Measurement Time + Long Interval Time [ms]
0
Dynamic OffCal
Count Plus Register
Measurement Timing
Dynamic Offset
Calibration
Judgment points (They means measurement points where the LC717A10
judges whether to perform dynamic offset calibration
All other measurement points other than the above
Judgment points within the execution range of dynamic offset calibration


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