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TPS65286 Fiches technique(PDF) 6 Page - Texas Instruments |
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TPS65286 Fiches technique(HTML) 6 Page - Texas Instruments |
6 / 46 page TPS65286 SLVSCG1 – MARCH 2014 www.ti.com 7.4 Thermal Information TPS65286 THERMAL METRIC(1) RHD UNIT 28 TERMINAL RθJA Junction-to-ambient thermal resistance(2) 35.6 RθJCtop Junction-to-case (top) thermal resistance(3) 24.2 RθJB Junction-to-board thermal resistance(4) 7.9 °C/W RψJT Junction-to-top characterization parameter(5) 0.3 RψJB Junction-to-board characterization parameter(6) 7.96 RθJCbot Junction-to-case (bottom) thermal resistance(7) 1.1 (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. (2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. (3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC- standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. (4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. (5) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7). (6) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7). (7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. Spacer 7.5 Electrical Characteristics TJ = 25°C, VIN = 24 V, fSW = 500 kHz, RnFAULTx = 100 kΩ (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INPUT SUPPLY VIN Input voltage range VIN1 and VIN2 4.5 28 V IDDSDN Shutdown supply current EN1 = EN2 = low 7.60 15 µA Quiescent current without buck EN = high, ENx = low, FB = 1 V IDDQ_NSW 0.8 mA switching Without buck switching Input quiescent current with buck EN = high, ENx = low, FB = 0.6 V IDDQ_SW 26 mA switching With buck switching Rising VIN 4 4.25 4.50 UVLO VIN under voltage lockout Falling VIN 3.75 4 4.25 V Hysteresis 0.25 Low side gate driver, controller, V7V load current = 0 A, V7V 6.10 6.25 6.4 V biasing supply VIN = 24 V IOCP_V7V Current limit of V7V LDO 83 mA ENABLE VENR Enable threshold Rising 1.21 1.26 V VENF Enable threshold Falling 1.10 1.17 V IENL Enable pull-up current EN = 1 V 3 µA IENH Enable pull-up current EN = 1.5 V 6 µA IENHYS Enable hysteresis current 3 µA 6 Submit Documentation Feedback Copyright © 2014, Texas Instruments Incorporated Product Folder Links: TPS65286 |
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