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AMC1100DWV Fiches technique(PDF) 3 Page - Texas Instruments

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No de pièce AMC1100DWV
Description  AMC1100 Fully-Differential Isolation Amplifier
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Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI - Texas Instruments

AMC1100DWV Fiches technique(HTML) 3 Page - Texas Instruments

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1
2
3
4
8
7
6
5
VDD2
VOUTP
VOUTN
GND2
VDD1
VINP
VINN
GND1
AMC1100
www.ti.com
SBAS562A – APRIL 2012 – REVISED DECEMBER 2014
5 Pin Configuration and Functions
DUB and DWV Packages
SOP-8 and SOIC-8
(Top View)
Pin Descriptions
PIN
FUNCTION
NAME
NO.
DESCRIPTION
GND1
4
Power
High-side analog ground
GND2
5
Power
Low-side analog ground
VDD1
1
Power
High-side power supply
VDD2
8
Power
Low-side power supply
VINN
3
Analog input
Inverting analog input
VINP
2
Analog input
Noninverting analog input
VOUTN
6
Analog output
Inverting analog output
VOUTP
7
Analog output
Noninverting analog output
6 Specifications
6.1 Absolute Maximum Ratings
over the operating ambient temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
Supply voltage, VDD1 to GND1 or VDD2 to GND2
–0.5
6
V
Analog input voltage at VINP, VINN
GND1 – 0.5
VDD1 + 0.5
V
Input current to any pin except supply pins
±10
mA
Maximum junction temperature, TJ Max
150
°C
Storage temperature range, Tstg
–65
150
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2500
V(ESD)
Electrostatic discharge
V
Charged device model (CDM), per JEDEC specification JESD22-
±1000
C101(2)
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2012–2014, Texas Instruments Incorporated
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