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ICS670-01 Fiches technique(PDF) 3 Page - Integrated Circuit Systems |
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ICS670-01 Fiches technique(HTML) 3 Page - Integrated Circuit Systems |
3 / 5 page ICS670-01 Low Phase Noise Zero Delay Buffer and Multiplier MDS 670-01 B 3 Revision 100900 Printed 11/15/00 Integrated Circuit Systems • 525 Race Street • San Jose •CA•95126•(408) 295-9800tel•http://www.icst.com Parameter Conditions Minimum Typical Maximum Units ABSOLUTE MAXIMUM RATINGS (n note 1) Supply voltage, VDD Referenced to GND 7 V Inputs and Clock Outputs Referenced to GND -0.5 VDD+0.5 V Ambient Operating Temperature 0 70 °C Ambient Operating Temperature, ICS670M-01I Industrial temperature -40 85 °C Soldering Temperature Max of 10 seconds 260 °C Storage temperature -65 150 °C DC CHARACTERISTICS (VDD = 3.3 V unless noted) Operating Voltage, VDD 3.0 5.5 V Input High Voltage, VIH 2 V Input Low Voltage, VIL 0.8 V Output High Voltage, VOH, CMOS level IOH=-4mA VDD-0.4 V Output High Voltage, VOH IOH=-12mA 2.4 V Output Low Voltage, VOL IOL=12mA 0.4 V Operating Supply Current, IDD No Load 35 mA Short Circuit Current Each output ±50 mA Internal Pull-up Resistor OE, select pins 200 k Ω Input Capacitance OE, select pins 5 pF AC CHARACTERISTICS (VDD = 3.3 V V unless noted) Input Frequency (see table on page 2) Depends on multiplier 5 160 MHz Output Frequency at 3.3V or 5V 160 MHz Output Clock Rise Time 0.8 to 2.0V, no load 1.5 ns Output Clock Fall Time 0.8 to 2.0V, no load 1.5 ns Output Clock Duty Cycle At VDD/2 45 50 55 % Input to output skew, rising edges Note 2 ±100 ps Maximum Absolute Jitter, short term ±45 ps Maximum Jitter, one sigma 15 ps Phase Noise, relative to carrier, 125 MHz (x5) 100 Hz offset -110 dBc/Hz Phase Noise, relative to carrier, 125 MHz (x5) 1 kHz offset -122 dBc/Hz Phase Noise, relative to carrier, 125 MHz (x5) 10 kHz offset -121 dBc/Hz Phase Noise, relative to carrier, 125 MHz (x5) 100 kHz offset -117 dBc/Hz Electrical Specifications Notes: 1. Stresses beyond those listed under Absolute Maximum Ratings could cause permanent damage to the device. Prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Rising edge of ICLK compared with rising edge of CLK2, with FBCLK connected to FBIN, and 15 pF load on CLK2. See the graph on page 4 for skew versus frequency and loading. |
Numéro de pièce similaire - ICS670-01 |
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Description similaire - ICS670-01 |
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