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AD7538KNZ Fiches technique(PDF) 4 Page - Analog Devices |
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AD7538KNZ Fiches technique(HTML) 4 Page - Analog Devices |
4 / 16 page AD7538 Rev. B | Page 4 of 16 AC PERFORMANCE CHARACTERISTICS These characteristics are included for design guidance only and are not subject to test. VDD = 11.4 V to 15.75 V, VREF = 10 V, VPIN3 = VPIN4 = 0 V, VSS = 0 V or −300 mV, output amplifier is AD711 except where noted. Table 2. Parameter TA = 25°C TA = TMIN, TMAX Unit Test Conditions/Comments Output Current Settling Time 1.5 μs max To 0.003% of full-scale range IOUT load= 100 Ω, CEXT = 13 pF DAC register alternately loaded with all 1s and all 0s; typical value of settling time is 0.8 μs Digital-to-Analog Glitch Impulse 20 nV-sec typ Measured with VREF = 0 V. IOUT load = 100 Ω, CEXT = 13 pF; DAC register alternately loaded with all 1s and all 0s Multiplying Feedthrough Error 3 5 mV p-p typ VREF = ±10 V, 10 kHz sine wave DAC Register loaded with all 0s Power Supply Rejection ΔGain/ΔVDD ±0.01 ±0.02 % per % max ΔVDD = ±5% Output Capacitance COUT (Pin 3) 260 260 pF max DAC register loaded with all 1s COUT (Pin 3) 130 130 pF max DAC register loaded with all 0s Output Noise Voltage Density (10 Hz to 100 kHz) 15 nV√Hz typ Measured between RFB and IOUT TIMING CHARACTERISTICS VDD = 11.4 V to 15.75 V, VREF = 10 V, VPIN3 = VPIN4 = 0 V, VSS = 0 V or −300 mV. All specifications TMIN to TMAX unless otherwise noted. See Figure 2 for a timing diagram. Table 3. Parameter1 Limit at TA = +25°C Limit at TA = 0°C to +70°C TA = −25°C to +85°C Limit at TA = −55°C to +125°C Unit Test Conditions/Comments t1 0 0 0 ns min CS to WR setup time t2 0 0 0 ns min CS to WR hold time t3 170 200 240 ns min LDAC pulse width t4 170 200 240 ns min Write pulse width t5 140 160 180 ns min Data setup time t6 20 20 30 ns min Data hold time 1 Temperature range as follows: J, K Versions: 0°C to +70°C A, B Versions: −25°C to +85°C S, T Versions: −55°C to +125°C |
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