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AD5025 Fiches technique(PDF) 17 Page - Analog Devices
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Rev. F | Page 17 of 28
Relative Accuracy (INL)
For the DAC, relative accuracy, or integral nonlinearity (INL),
is a measure of the maximum deviation in LSBs from a straight
line passing through the endpoints of the DAC transfer function.
Figure 8, Figure 9, and Figure 10 show plots of typical INL vs.
Differential Nonlinearity (DNL)
DNL is the difference between the measured change and the
ideal 1 LSB change between any two adjacent codes. A specified
differential nonlinearity of ±1 LSB maximum ensures monoto-
nicity. This DAC is guaranteed monotonic by design. Figure 11,
Figure 12, and Figure 13 show plots of typical DNL vs. code.
Offset error is a measure of the difference between the actual
and the ideal V
, expressed in millivolts in the linear
region of the transfer function. Offset error is calculated using
a reduced code range—AD5064/AD5604-1: Code 512 to Code
65,024; AD5044: Code 128 to Code 16,256; AD5024: Code 32 to
Code 4064, with output unloaded. Offset error can be negative or
positive and is expressed in millivolts.
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Offset Error Temperature Coefficient
Offset error temperature coefficient is a measure of the change
in offset error with a change in temperature. It is expressed in
microvolts per degree Celsius.
Gain Temperature Coefficient
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in parts per million of
full-scale range per degree Celsius.
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded into the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed as a
percentage of the full-scale range. Measured with V
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nanovolt-
seconds and is measured when the digital input code is changed
by 1 LSB at the major carry transition (0x7FFF to 0x8000). See
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
for full-scale output of the DAC. It is measured
in decibels. V
is held at 2.5 V, and V
is varied by ±10%.
Measured with V
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale.
It is expressed in microvolts.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to another
DAC kept at midscale. It is expressed in microvolts per milliamp.
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated (that is, LDAC is high). It is expressed in
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device, but it is measured when the DAC is not being written
to (SYNC held high). It is specified in nanovolt-seconds and
measured with one simultaneous data and clock pulse loaded
to the DAC.
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s or vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s or vice versa) while keeping LDAC
high, and then pulsing LDAC low and monitoring the output of
the DAC whose digital code has not changed. The area of the
glitch is expressed in nanovolt-seconds.
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