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LM158AHRQMLV Fiches technique(PDF) 9 Page - Texas Instruments |
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LM158AHRQMLV Fiches technique(HTML) 9 Page - Texas Instruments |
9 / 30 page LM158QML www.ti.com SNOSAP3F – JULY 2005 – REVISED MARCH 2013 SMD 5962–8771003 ELDRS Free Only DC Drift Parameters (continued) The following conditions apply, unless otherwise specified. All voltages referenced to device ground. Delta calculations are performed on QMLV devices at Group B, Subgroup 5 only. Sub- Parameter Test Conditions Notes Min Max Units groups ±IIB Input Bias Current +VCC = 5V, VCM = 0V See(1) -10 10 nA 1 (1) The direction of the input current is out of the IC due to the PNP input stage. This current is essentially constant, independent of the state of the output so no loading change exists on the input lines. SMD 5962–8771003 ELDRS Free Only 100K Post Radiation Limits @ +25°C (1) DC Parameters The following conditions apply, unless otherwise specified. All voltages referenced to device ground. Parameter Test Conditions Notes Min Max Units Sub - groups VIO Input Offset Voltage +VCC = 30V, VCM = 0V, See(1) -4.0 4.0 mV 1 RS = 50Ω, VO = 1.4V +VCC = 30V, VCM = 28.5V, See(1) -4.0 4.0 mV 1 RS = 50Ω, VO = 1.4V +VCC = 5V, VCM = 0V, See(1) -4.0 4.0 mV 1 RS = 50Ω, VO = 1.4V ±IIB Input Bias Current +VCC = 5V, VCM = 0V See(1)(2) -60 -1.0 nA 1 (1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table. These parts may be sensitive in a high dose environment. Low dose rate testing has been performed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL-STD-883, with no enhanced low dose rate sensitivity (ELDRS). (2) The direction of the input current is out of the IC due to the PNP input stage. This current is essentially constant, independent of the state of the output so no loading change exists on the input lines. Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Links: LM158QML |
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