Moteur de recherche de fiches techniques de composants électroniques
  French  ▼
ALLDATASHEET.FR

X  

SN74BCT8373DW Fiches technique(PDF) 9 Page - Texas Instruments

No de pièce SN74BCT8373DW
Description  SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Download  21 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

SN74BCT8373DW Fiches technique(HTML) 9 Page - Texas Instruments

Back Button SN74BCT8373DW Datasheet HTML 5Page - Texas Instruments SN74BCT8373DW Datasheet HTML 6Page - Texas Instruments SN74BCT8373DW Datasheet HTML 7Page - Texas Instruments SN74BCT8373DW Datasheet HTML 8Page - Texas Instruments SN74BCT8373DW Datasheet HTML 9Page - Texas Instruments SN74BCT8373DW Datasheet HTML 10Page - Texas Instruments SN74BCT8373DW Datasheet HTML 11Page - Texas Instruments SN74BCT8373DW Datasheet HTML 12Page - Texas Instruments SN74BCT8373DW Datasheet HTML 13Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 9 / 21 page
background image
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DTYPE LATCHES
SCBS471 − JUNE 1990 − REVISED JUNE 1994
2−9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251−1443
data register description
boundary-scan register
The boundary-scan register (BSR) is 18 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function output pin. The BSR is used 1) to store test
data that is to be applied internally to the inputs of the normal on-chip logic and/or externally to the device output
terminals, and/or 2) to capture data that appears internally at the outputs of the normal on-chip logic and/or
externally at the device input terminals.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR may change during Run-Test/Idle as determined by the current instruction. The contents
of the BSR are not changed in Test-Logic-Reset.
The BSR order of scan is from TDI through bits 17−0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan-Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
17
LE
15
1D
7
1Q
16
OE
14
2D
6
2Q
13
3D
5
3Q
12
4D
4
4Q
11
5D
3
5Q
10
6D
2
6Q
9
7D
1
7Q
8
8D
0
8Q
boundary-control register
The boundary-control register (BCR) is two bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE
 instruction set. Such operations
include PRPG and PSA. Table 3 shows the test operations that are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 10, which selects the PSA test operation. The BCR order of scan is illustrated in
Figure 3.
TDO
TDI
Bit 0
(LSB)
Bit 1
(MSB)
Figure 3. Boundary-Control Register Order of Scan


Numéro de pièce similaire - SN74BCT8373DW

FabricantNo de pièceFiches techniqueDescription
logo
Texas Instruments
SN74BCT8373A TI-SN74BCT8373A Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADW TI-SN74BCT8373ADW Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWE4 TI-SN74BCT8373ADWE4 Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWR TI-SN74BCT8373ADWR Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWRE4 TI-SN74BCT8373ADWRE4 Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
More results

Description similaire - SN74BCT8373DW

FabricantNo de pièceFiches techniqueDescription
logo
Texas Instruments
SN54BCT8373A TI-SN54BCT8373A Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN54BCT8374A TI-SN54BCT8374A Datasheet
474Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54BCT8374A TI-SN54BCT8374A_08 Datasheet
644Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54BCT8244A TI-SN54BCT8244A Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244A TI-SN54BCT8244A_07 Datasheet
612Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244A TI-SN54BCT8244A_08 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
logo
Unisonic Technologies
U74AHCT373 UTC-U74AHCT373_15 Datasheet
234Kb / 6P
   OCTAL TRANSPARENT D-TYPE LATCHES WITH
U74HCT373 UTC-U74HCT373_15 Datasheet
237Kb / 6P
   OCTAL TRANSPARENT D-TYPE LATCHES WITH
logo
Texas Instruments
SN54BCT8245A TI-SN54BCT8245A Datasheet
309Kb / 22P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8240A TI-SN54BCT8240A Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21


Fiches technique Télécharger

Go To PDF Page


Lien URL




Politique de confidentialité
ALLDATASHEET.FR
ALLDATASHEET vous a-t-il été utile ?  [ DONATE ] 

À propos de Alldatasheet   |   Publicité   |   Contactez-nous   |   Politique de confidentialité   |   Echange de liens   |   Fabricants
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com