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TPS70751MPWPREP Fiches technique(PDF) 1 Page - Texas Instruments |
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TPS70751MPWPREP Fiches technique(HTML) 1 Page - Texas Instruments |
1 / 41 page www.ti.com FEATURES 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 PWP PACKAGE (TOP VIEW) NC V IN1 V IN1 MR1 MR2 EN SEQ GND V IN2 V IN2 NC V OUT1 V OUT1 V /FB1 SENSE1 PG1 RESET V /FB2 SENSE2 V OUT2 V OUT2 NC DESCRIPTION TPS70751-EP DUAL-OUTPUT LOW-DROPOUT VOLTAGE REGULATOR WITH POWER-UP SEQUENCING FOR SPLIT-VOLTAGE DSP SYSTEMS SLVS718 – DECEMBER 2006 • Controlled Baseline • Ultralow 190-µA (Typ) Quiescent Current – One Assembly/Test Site, One Fabrication • 1-µA Input Current During Standby Site • Low Noise: 65 µVrms Without Bypass • Enhanced Diminishing Manufacturing Sources Capacitor (DMS) Support • Quick Output Capacitor Discharge Feature • Enhanced Product-Change Notification • Two Manual Reset Inputs • Qualification Pedigree (1) • 2% Accuracy Over Load and Temperature • Dual Output Voltages for Split-Supply • Undervoltage Lockout (UVLO) Feature Applications • 20-Pin PowerPAD™ Thin Shrink Small-Outline • Selectable Power-Up Sequencing for DSP Package (TSSOP) Applications (See Part Number TPS708xx for • Thermal Shutdown Protection Independently Enabled Outputs) • Output Current Range of 250 mA on Regulator 1 and 125 mA on Regulator 2 • Fast Transient Response • 3.3-V/1.8-V Fixed Voltage Outputs • Open-Drain Power-On Reset With 120-ms Delay • Open-Drain Power Good for Regulator 1 (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified xxxxx performance and environmental limits. The TPS707xx family devices are designed to provide a complete power-management solution for TI DSP, processor power, ASIC, FPGA, and digital applications where dual-output voltage regulators are required. Easy programmability of the sequencing function makes this family ideal for any TI DSP applications with power-sequencing requirements. Differentiated features, such as accuracy, fast transient response, SVS supervisory circuit (power-on reset), manual reset inputs, and enable function, provide a complete system solution. The TPS707xx family of voltage regulators offer very low dropout (LDO) voltage and dual outputs with power-up sequence control, which is designed primarily for DSP applications. These devices have extremely low noise output performance without using any added filter bypass capacitors, and are designed to have a fast transient response and be stable with 10- µF low ESR capacitors. The TPS70751 has a fixed voltage of 3.3 V/1.8 V. Regulator 1 can support up to 250 mA and regulator 2 can support up to 125 mA. Separate voltage inputs allow the designer to configure the source power. Because the PMOS device behaves as a low-value resistor, the dropout voltage is very low (typically 83 mV on regulator 1) and is directly proportional to the output current. Additionally, since the PMOS pass element is a voltage-driven device, the quiescent current is very low and independent of output loading (maximum of 230 µA over the full range of output current). This LDO family also features a sleep mode; applying a high signal to EN (enable) shuts down both regulators, reducing the input current to 1 µA at T J = 25°C. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerPAD is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2006, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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