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74ACT11175N Datasheet(Fiches technique) 1 Page - Texas Instruments

Numéro de pièce 74ACT11175N
Description  QUADRUPLE D-TYPE FLIP-FLOP WITH CLEAR
Télécharger  6 Pages
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
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74ACT11175
QUADRUPLE DTYPE FLIPFLOP WITH CLEAR
SCAS089 − D3385, DECEMBER 1989 − REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77001
Copyright
1993, Texas Instruments Incorporated
2−1
Inputs Are TTL-Voltage Compatible
Buffered Clock and Direct Clear Inputs
Applications Include: Buffer/Storage
Registers, Shift Registers, Pattern
Generators
Fully-Buffered Outputs for Maximum
Isolation From External Disturbances
Flow-Through Architecture to Optimize
PCB Layout
Center-Pin V
CC and GND Configurations
Minimize High-Speed Switching Noise
EPICt (Enhanced-Performance Implanted
CMOS) 1-
mm Process
500-mA Typical Latch-Up Immunity at 125°C
Package Options Include Plastic Small-
Outline Packages and Standard Plastic
300-mil DIPs
description
This device contains six D-type flip-flops and is positive-edge-triggered with a direct clear input. Information
at the D inputs meeting the setup time requirements is transferred to the outputs on the positive-going edge of
the clock pulse. Clock triggering occurs at a particular voltage level and is not directly related to the transition
time of the positive-going pulse. When the clock input is at either the high or low level, the D input signal has
no effect at the output.
The 74AC11175 is characterized for operation from − 40
°C to 85°C.
FUNCTION TABLE
(each flip-flop)
INPUTS
OUTPUTS
CLR
CLK
D
Q
Q
L
X
X
L
H
H
HH
L
H
LL
H
H
L
X
Q0
Q0
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1Q
2Q
2Q
GND
GND
GND
GND
3Q
3Q
4Q
1Q
CLR
1D
2D
VCC
VCC
3D
4D
CLK
4Q
DW OR N PACKAGE
(TOP VIEW)
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.




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