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BAW56TT1G Fiches technique(PDF) 2 Page - ON Semiconductor |
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BAW56TT1G Fiches technique(HTML) 2 Page - ON Semiconductor |
2 / 4 page BAW56TT1G http://onsemi.com 2 ELECTRICAL CHARACTERISTICS (TA =25C unless otherwise noted) Characteristic Symbol Min Max Unit OFF CHARACTERISTICS Reverse Breakdown Voltage (I(BR) = 100 mAdc) V(BR) 70 -- Vdc Reverse Voltage Leakage Current (VR =25 Vdc, TJ = 150C) (VR =70 Vdc) (VR =70 Vdc, TJ = 150C) IR -- -- -- 30 2.5 50 mAdc Diode Capacitance (VR = 0,f= 1.0MHz) CD -- 2.0 pF Forward Voltage (IF =1.0 mAdc) (IF =10 mAdc) (IF =60 mAdc) (IF = 150 mAdc) VF -- -- -- -- 715 855 1000 1250 mVdc Reverse Recovery Time (IF =IR =10 mAdc, RL = 100 Ω,IR(REC) = 1.0 mAdc) (Figure 1) trr -- 6.0 ns Notes: 1. A 2.0 kΩ variable resistor adjusted for a Forward Current (IF)of10mA. Notes: 2. Input pulse is adjusted so IR(peak) is equal to 10 mA. Notes: 3. tp »trr +10 V 2.0 k 820 Ω 0.1 mF DUT VR 100 mH 0.1 mF 50 Ω OUTPUT PULSE GENERATOR 50 Ω INPUT SAMPLING OSCILLOSCOPE tr tp t 10% 90% IF IR trr t iR(REC) =1.0 mA OUTPUT PULSE (IF =IR = 10 mA; MEASURED at iR(REC) =1.0 mA) IF INPUT SIGNAL Figure 1. Recovery Time Equivalent Test Circuit |
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