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TPS65253RHD Fiches technique(PDF) 2 Page - Texas Instruments |
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TPS65253RHD Fiches technique(HTML) 2 Page - Texas Instruments |
2 / 24 page BUCK1 BUCK2 V7V OSC ROSC BST2 LX2 LX2 FB2 CMP2 GND VIN Vout Buck2 VIN2 EN2 SS2 CV7V ROSC CSS2 CBST2 L2 RC2 CC2 COUT2 CIN2 REFERENCE EN2 LOW_P LOW_P RLIM2 V3V CV3V CRoll2 BST1 LX1 LX1 FB1 CMP1 Vout Buck1 CBST1 L1 RC1 CC1 COUT1 CRoll1 VIN1 EN1 SS1 CSS1 EN1 RLIM1 RLIM1 RLIM2 Light Load Power Saving CIN1 PGOOD PGOOD GENERATOR Vpullup RFB1U RFB1L RFB2U RFB2L TPS65253 SLVSAW8 – JUNE 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM 2 Copyright © 2011, Texas Instruments Incorporated |
Numéro de pièce similaire - TPS65253RHD |
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Description similaire - TPS65253RHD |
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