Moteur de recherche de fiches techniques de composants électroniques |
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ISL54227IRTZ-T Fiches technique(PDF) 7 Page - Intersil Corporation |
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ISL54227IRTZ-T Fiches technique(HTML) 7 Page - Intersil Corporation |
7 / 18 page ISL54227 7 FN7593.0 July 2, 2010 Test Circuits and Waveforms Logic input waveform is inverted for switches that have the opposite logic sense. FIGURE 1A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 1B. TEST CIRCUIT FIGURE 1. SWITCHING TIMES FIGURE 2. rON TEST CIRCUIT FIGURE 3. CAPACITANCE TEST CIRCUIT FIGURE 4. CROSSTALK TEST CIRCUIT 50% tr < 20ns tf < 20ns tOFF 90% VDD 0V VINPUT 0V tON LOGIC INPUT SWITCH INPUT SWITCH OUTPUT 90% VOUT VOUT V(INPUT) RL RL rON + ------------------------ = SWITCH INPUT VIN VOUT RL CL Dx COMx 50 Ω 50pF GND VDD C OE VINPUT VDD C VDD COMx Dx GND VHSDX V1 rON = V1/17mA 17mA Repeat test for all switches. OE VDD C GND COMx Dx IMPEDANCE ANALYZER 0V OR Repeat test for all switches. OE VDD ANALYZER VDD C COM+ SIGNAL GENERATOR RL GND D+ 50 Ω NC D- COM- Signal direction through switch is reversed, worst case values are recorded. Repeat test for all switches. OE VIN |
Numéro de pièce similaire - ISL54227IRTZ-T |
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Description similaire - ISL54227IRTZ-T |
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