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IP4337CX18 Fiches technique(PDF) 9 Page - NXP Semiconductors

No de pièce IP4337CX18
Description  7-channel integrated filter network with ESD input protection to IEC 61000-4-2 level 4
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IP4337CX18 Fiches technique(HTML) 9 Page - NXP Semiconductors

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© NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 — 20 August 2009
9 of 12
NXP Semiconductors
7-channel integrated filter network with ESD input protection
For further information on temperature profiles, refer to application note
“Surface mount reflow soldering description”.
9.3.1 Stand off
The stand off between the substrate and the chip is determined by:
The amount of printed solder on the substrate
The size of the solder land on the substrate
The bump height on the chip
The higher the stand off, the better the stresses are released due to TEC (Thermal
Expansion Coefficient) differences between substrate and chip.
9.3.2 Quality of solder joint
A flip-chip joint is considered to be a good joint when the entire solder land has been
wetted by the solder from the bump. The surface of the joint should be smooth and the
shape symmetrical. The soldered joints on a chip should be uniform. Voids in the bumps
after reflow can occur during the reflow process in bumps with high ratio of bump diameter
to bump height, i.e. low bumps with large diameter. No failures have been found to be
related to these voids. Solder joint inspection after reflow can be done with X-ray to
monitor defects such as bridging, open circuits and voids.
9.3.3 Rework
In general, rework is not recommended. By rework we mean the process of removing the
chip from the substrate and replacing it with a new chip. If a chip is removed from the
substrate, most solder balls of the chip will be damaged. In that case it is recommended
not to re-use the chip again.
MSL: Moisture Sensitivity Level
Fig 8.
Temperature profiles for large and small components
minimum peak temperature
= minimum soldering temperature
maximum peak temperature
= MSL limit, damage level

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