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TPS3808G01DRVTG4 Fiches technique(PDF) 2 Page - Texas Instruments |
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TPS3808G01DRVTG4 Fiches technique(HTML) 2 Page - Texas Instruments |
2 / 21 page ABSOLUTE MAXIMUM RATINGS (1) TPS3808 SBVS050J – MAY 2004 – REVISED AUGUST 2008 .......................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) PRODUCT NOMINAL SUPPLY VOLTAGE(2) THRESHOLD VOLTAGE (VIT) TPS3808G01 Adjustable 0.405V TPS3808G09 0.9V 0.84V TPS3808G12 1.2V 1.12V TPS3808G125 1.25V 1.16V TPS3808G15 1.5V 1.40V TPS3808G18 1.8V 1.67V TPS3808G19 1.9V 1.77V TPS3808G25 2.5V 2.33V TPS3808G30 3.0V 2.79V TPS3808G33 3.3V 3.07V TPS3808G50 5.0V 4.65V (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Custom threshold voltages from 0.82V to 3.3V, 4.4V to 5.0V are available through the use of factory EEPROM programming. Minimum order quantities apply. Contact factory for details and availability. Over operating junction temperature range, unless otherwise noted. TPS3808 UNIT Input voltage range, VDD –0.3 to 7.0 V CT voltage range, VCT –0.3 to VDD + 0.3 V Other voltage ranges: VRESET, VMR, VSENSE –0.3 to 7 V RESET pin current 5 mA Operating junction temperature range, TJ (2) –40 to +150 °C Storage temperature range, TSTG –65 to +150 °C ESD rating, HBM 2 kV ESD rating, CDM 500 V (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. (2) As a result of the low dissipated power in this device, it is assumed that TJ = TA. 2 Submit Documentation Feedback Copyright © 2004–2008, Texas Instruments Incorporated Product Folder Link(s): TPS3808 |
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