74AHC1G126GM datasheet(9/16 Pages) NXP

No de pièce	74AHC1G126GM

Description	Bus buffer/line driver; 3-state

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Fabricant	NXP [NXP Semiconductors]

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74AHC_AHCT1G126_7

Product data sheet

Rev. 07 — 17 June 2009

9 of 16

NXP Semiconductors

74AHC1G126; 74AHCT1G126

Bus buffer/line driver; 3-state

Test data is given in Table 10.

Deﬁnitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Fig 9.

Test circuit for measuring switching times

VM

tW

10 %

90 %

0 V

VI

negative

pulse

positive

pulse

0 V

VM

90 %

10 %

tf

tr

tf

001aad983

DUT

VCC

VI

VO

RT

RL

S1

CL

open

G

Table 10.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

tPZH, tPHZ

tPZL, tPLZ

74AHC1G126

VCC

≤ 3 ns

15 pF, 50 pF

1 k

Ω

open

GND

VCC

74AHCT1G126

3 V

≤ 3 ns

15 pF, 50 pF

1 k

Ω

open

GND

VCC

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Nexperia B.V. All right...	74AHC1G126GM	248Kb / 15P	Bus buffer/line driver; 3-state Rev. 10 - 11 January 2022

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