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BD3538HFN Fiches technique(PDF) 8 Page - Rohm

No de pièce BD3538HFN
Description  Termination Regulators for DDR-SDRAM
Download  12 Pages
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Fabricant  ROHM [Rohm]
Site Internet  http://www.rohm.com
Logo ROHM - Rohm

BD3538HFN Fiches technique(HTML) 8 Page - Rohm

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NOTE FOR USE
1.Absolute maximum ratings
For the present product, thoroughgoing quality control is carried out, but in the event that applied voltage, working
temperature range, and other absolute maximum rating are exceeded, the present product may be destroyed. Because it is
unable to identify the short mode, open mode, etc., if any special mode is assumed, which exceeds the absolute maximum
rating, physical safety measures are requested to be taken, such as fuses, etc.
2.GND potential
Bring the GND terminal potential to the minimum potential in any operating condition.
3.Thermal design
Consider allowable loss (Pd) under actual working condition and carry out thermal design with sufficient margin provided.
4.Terminal-to-terminal short-circuit and erroneous mounting
When the present IC is mounted to a printed circuit board, take utmost care to direction of IC and displacement. In the event
that the IC is mounted erroneously, IC may be destroyed. In the event of short-circuit caused by foreign matter that enters in
a clearance between outputs or output and power-GND, the IC may be destroyed.
5.Operation in strong electromagnetic field
The use of the present IC in the strong electromagnetic field may result in maloperation, to which care must be taken.
6.Built-in thermal shutdown protection circuit
The present IC incorporates a thermal shutdown protection circuit (TSD circuit). The working temperature is 175°C
(standard value) and has a -15°C (standard value) hysteresis width. When the IC chip temperature rises and the TSD circuit
operates, the output terminal is brought to the OFF state. The built-in thermal shutdown protection circuit (TSD circuit) is first
and foremost intended for interrupt IC from thermal runaway, and is not intended to protect and warrant the IC.
Consequently, never attempt to continuously use the IC after this circuit is activated or to use the circuit with the activation of
the circuit premised.
7.Capacitor across output and GND
In the event a large capacitor is connected across output and GND, when Vcc and VIN are short-circuited with 0V or GND for
some kind of reasons, current charged in the capacitor flows into the output and may destroy the IC. Use a capacitor smaller
than 1000 μF between output and GND.
8.Inspection by set substrate
In the event a capacitor is connected to a pin with low impedance at the time of inspection with a set substrate, there is a fear
of applying stress to the IC. Therefore, be sure to discharge electricity for every process. As electrostatic measures,
provide grounding in the assembly process, and take utmost care in transportation and storage. Furthermore, when the set
substrate is connected to a jig in the inspection process, be sure to turn OFF power supply to connect the jig and be sure to
turn OFF power supply to remove the jig.
9. Inputs to IC terminals
This device is a monolithic IC with P
+ isolation between P-substrate and each element as illustrated below. This P-layer and
the N-layer of each element form a PN junction which works as:
a diode if the electric potentials at the terminals satisfy the following relationship; GND>Terminal A>Terminal B, or
a parasitic transistor if the electric potentials at the terminals satisfy the following relationship; Terminal B>GND Terminal A.
The structure of the IC inevitably forms parasitic elements, the activation of which may cause interference among circuits,
and/or malfunctions contributing to breakdown. It is therefore requested to take care not to use the device in such manner
that the voltage lower than GND (at P-substrate) may be applied to the input terminal, which may result in activation of
parasitic elements.
10. GND wiring pattern
When both a small-signal GND and high current GND are present, single-point grounding (at the set standard point) is
recommended, in order to separate the small-signal and high current patterns, and to be sure the voltage change stemming
from the wiring resistance and high current does not cause any voltage change in the small-signal GND. In the same way,
care must be taken to avoid wiring pattern fluctuations in any connected external component GND.
Resistor
Transistor (NPN)
N
N
N
P
+
P
+
P
P substrate
GND
Parasitic element
Pin A
N
N
P
+
P
+
P
P substrate
GND
Parasitic element
Pin B
C
B
E
N
GND
Pin A
Parasitic
element
Pin B
Other adjacent elements
E
B
C
GND
Parasitic
element


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