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SN74ABTH182504APM Fiches technique(PDF) 11 Page - Texas Instruments

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No de pièce SN74ABTH182504APM
Description  SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
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Fabricant  TI [Texas Instruments]
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SN74ABTH182504APM Fiches technique(HTML) 11 Page - Texas Instruments

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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run
(RUNT) instruction to implement additional test operations not included in the basic SCOPE
™ instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The BCR order of scan is shown in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan


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