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74FCT162543CTPVCT Fiches technique(PDF) 3 Page - Texas Instruments

No de pièce 74FCT162543CTPVCT
Description  16-Bit Latched Transceivers
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Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
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74FCT162543CTPVCT Fiches technique(HTML) 3 Page - Texas Instruments

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CY74FCT16543T
CY74FCT162543T
CY74FCT162H543T
3
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min.
Typ.[5]
Max.
Unit
VIH
Input HIGH Voltage
2.0
V
VIL
Input LOW Voltage
0.8
V
VH
Input Hysteresis[6]
100
mV
VIK
Input Clamp Diode Voltage
VCC=Min., IIN=−18 mA
−0.7
−1.2
V
IIH
Input HIGH Current
VCC=Max., VI=VCC
±1
µA
IIL
Input LOW Current
VCC=Max., VI=GND
±1
µA
IOZH
High Impedance Output Cur-
rent (Three-State Output pins)
VCC=Max., VOUT=2.7V
±1
µA
IOZL
High Impedance Output Cur-
rent (Three-State Output pins)
VCC=Max., VOUT=0.5V
±1
µA
IOS
Short Circuit Current[7]
VCC=Max., VOUT=GND
−80
−140
−200
mA
IO
Output Drive Current[7]
VCC=Max., VOUT=2.5V
−50
−180
mA
IOFF
Power-Off Disable
VCC=0V, VOUT≤4.5V
[8]
±1
µA
Notes:
1.
A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA, and OEBA.
2.
Data prior to LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level. L = LOW Voltage Level.
X = Don’t Care. Z = High Impedance.
3.
Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4.
Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
5.
Typical values are at VCC= 5.0V, TA= +25˚C ambient.
6.
This parameter is specified but not tested.
7.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
8.
Tested at +25˚C.
9.
On the 74FCT162H543T, these pins have bus hold.


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