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74FCT162841CTPACT Fiches technique(PDF) 2 Page - Texas Instruments

No de pièce 74FCT162841CTPACT
Description  20-Bit Latches
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Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
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74FCT162841CTPACT Fiches technique(HTML) 2 Page - Texas Instruments

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CY74FCT16841T
CY74FCT162841T
2
Maximum Ratings[3, 4]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature
......................................−55°C to +125°C
Ambient Temperature with
Power Applied
..................................................−55°C to +125°C
DC Input Voltage
.................................................−0.5V to +7.0V
DC Output Voltage
..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)
...........................−60 to +120 mA
Power Dissipation .......................................................... 1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Pin Description
Name
Description
D
Data Inputs
LE
Latch Enable Input (Active HIGH)
OE
Output Enable Input (Active LOW)
O
Three-State Outputs
Function Table[1]
Inputs
Outputs
D
LE
OE
Q
H
H
L
H
L
H
L
L
X
L
L
Q[2]
X
X
H
Z
Operating Range
Range
Ambient
Temperature
VCC
Industrial
−40°C to +85°C
5V
± 10%
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min.
Typ.[5]
Max.
Unit
VIH
Input HIGH Voltage
Logic HIGH Level
2.0
V
VIL
Input LOW Voltage
Logic LOW Level
0.8
V
VH
Input Hysteresis[6]
100
mV
VIK
Input Clamp Diode Voltage
VCC=Min., IIN=−18 mA
−0.7
−1.2
V
IIH
Input HIGH Current
VCC=Max., VI=VCC
±1
µA
IIL
Input LOW Current
VCC=Max., VI=GND
±1
µA
IOZH
High Impedance Output
Current (Three-State Output pins)
VCC=Max., VOUT=2.7V
±1
µA
IOZL
High Impedance Output
Current (Three-State Output pins)
VCC=Max., VOUT=0.5V
±1
µA
IOS
Short Circuit Current[7]
VCC=Max., VOUT=GND
−80
−140
−200
mA
IO
Output Drive Current[7]
VCC=Max., VOUT=2.5V
−50
−180
mA
IOFF
Power-Off Disable
VCC=0V, VOUT≤4.5V
[8]
±1
µA
Notes:
1.
H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance.
2.
Output level before LE HIGH-to-LOW Transition.
3.
Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4.
Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
5.
Typical values are at VCC= 5.0V, TA= +25˚C ambient.
6.
This parameter is specified but not tested.
7.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
8.
Tested at +25˚C.


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