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AM26LV31E-EP Fiches technique(PDF) 5 Page - Texas Instruments |
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AM26LV31E-EP Fiches technique(HTML) 5 Page - Texas Instruments |
5 / 12 page SWITCHING CHARACTERISTICS ESD PROTECTION AM26LV31E-EP www.ti.com............................................................................................................................................................................................ SLLS947 – NOVEMBER 2008 over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT tPHL Propagation delay time, high- to low-level output 4 8 12 ns See Figure 2 tPLH Propagation delay time, low- to high-level output 3.5 8 12 ns tt Transition time (tr or tf) See Figure 2 5 10 ns tPZH Output-enable time to high level See Figure 3 10 20 ns tPZL Output-enable time to low level See Figure 4 10 20 ns tPHZ Output-disable time from high level See Figure 3 10 20 ns tPLZ Output-disable time from low level See Figure 4 10 20 ns tsk(p) Pulse skew 0.5 3 ns tsk(o) Skew limit (pin to pin) See Figure 2(2)(3) 1.5 ns tsk(lim) Skew limit (device to device) 3 ns f(max) Maximum operating frequency See Figure 2 32 MHz (1) All typical values are at VCC = 3.3 V, TA = 25°C. (2) Pulse skew is defined as the |tPLH – tPHL| of each channel of the same device. (3) Skew limit (device to device) is the maximum difference in propagation delay times between any two channels of any two devices. PARAMETER TEST CONDITIONS TYP UNIT HBM ±15 Driver output IEC61000-4-2, Air-Gap Discharge ±15 kV IEC61000-4-2, Contact Discharge ±8 Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): AM26LV31E-EP |
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