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74VHCT00ATTR Datasheet(Fiches technique) 3 Page - STMicroelectronics

Numéro de pièce 74VHCT00ATTR
Description  QUAD 2-INPUT NAND GATE
Télécharger  11 Pages
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Fabricant  STMICROELECTRONICS [STMicroelectronics]
Site Internet  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

74VHCT00ATTR Datasheet(HTML) 3 Page - STMicroelectronics

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Table 6: DC Specifications
Table 7: AC Electrical Characteristics (Input tr = tf = 3ns)
(*) Voltage range is 5.0V
± 0.5V
Table 8: Capacitive Characteristics
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)
Symbol
Parameter
Test Condition
Value
Unit
VCC
(V)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
VIH
High Level Input
Voltage
4.5 to
5.5
22
2
V
VIL
Low Level Input
Voltage
4.5 to
5.5
0.8
0.8
0.8
V
VOH
High Level Output
Voltage
4.5
IO=-50 µA
4.4
4.5
4.4
4.4
V
4.5
IO=-8 mA
3.94
3.8
3.7
VOL
Low Level Output
Voltage
4.5
IO=50 µA
0.0
0.1
0.1
0.1
V
4.5
IO=8 mA
0.36
0.44
0.55
II
Input Leakage
Current
0 to
5.5
VI = 5.5V or GND
± 0.1
± 1.0
± 1.0
µA
ICC
Quiescent Supply
Current
5.5
VI = VCC or GND
220
20
µA
+ICC
Additional Worst
Case Supply
Current
5.5
One Input at 3.4V,
other input at VCC
or GND
1.35
1.5
1.5
mA
IOPD
Output Leakage
Current
0
VOUT = 5.5V
0.5
5.0
5.0
µA
Symbol
Parameter
Test Condition
Value
Unit
VCC (*)
(V)
CL
(pF)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
tPLH
tPHL
Propagation Delay
Time
5.0
15
5.0
7.0
1.0
8.0
1.0
8.0
ns
5.0
50
5.5
8.0
1.0
9.0
1.0
9.0
Symbol
Parameter
Test Condition
Value
Unit
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
CIN
Input Capacitance
410
10
10
pF
CPD
Power Dissipation
Capacitance
(note 1)
10.5
pF


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