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CAT525_0711 Fiches technique(PDF) 3 Page - Catalyst Semiconductor

No de pièce CAT525_0711
Description  Quad Digitally Programmable Potentiometer (DPP™) with 256 Taps and Microwire Interface
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Fabricant  CATALYST [Catalyst Semiconductor]
Site Internet  http://www.catalyst-semiconductor.com
Logo CATALYST - Catalyst Semiconductor

CAT525_0711 Fiches technique(HTML) 3 Page - Catalyst Semiconductor

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CAT525
© Catalyst Semiconductor, Inc.
3
Doc. No. MD-2001 Rev. H
Characteristics subject to change without notice
ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Supply Voltage*
VDD to GND
-0.5 to +7
V
Inputs
CLK to GND
-0.5 to VDD +0.5
V
CS to GND
-0.5 to VDD +0.5
V
DI to GND
-0.5 to VDD +0.5
V
RDY/BSY
¯¯¯¯ to GND -0.5 to VDD +0.5
V
PROG to GND
-0.5 to VDD +0.5
V
VREFH to GND
-0.5 to VDD +0.5
V
VREFL to GND
-0.5 to VDD +0.5
V
Parameters
Ratings
Units
Outputs
D0 to GND
-0.5 to VDD +0.5
V
VOUT 1– 4 to GND
-0.5 to VDD +0.5
V
Operating Ambient Temperature
Commercial
(‘C’ or Blank suffix)
0 to +70
°C
Industrial (‘I’ suffix)
-40 to +85
°C
Junction Temperature
+150
°C
Storage Temperature
-65 to +150
°C
Lead Soldering (10 sec max)
+300
°C
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Test Method
Min
Max
Units
VZAP
(2)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
V
ILTH
(2)(3)
Latch-Up
JEDEC Standard 17
100
mA
POWER SUPPLY
Symbol
Parameter
Conditions
Min
Typ
Max
Units
IDD1
Supply Current (Read)
Normal Operating
400
600
µA
Programming, VDD = 5V
1600
2500
µA
IDD2
Supply Current (Write)
VDD = 3V
1000
1600
µA
VDD
Operating Voltage Range
2.7
5.5
V
LOGIC INPUTS
Symbol
Parameter
Conditions
Min
Typ
Max
Units
IIH
Input Leakage Current
VIN = VDD
10
µA
IIL
Input Leakage Current
VIN = 0V
-10
µA
VIH
High Level Input Voltage
2
VDD
V
VIL
Low Level Input Voltage
0
0.8
V
LOGIC OUTPUTS
Symbol
Parameter
Conditions
Min
Typ
Max
Units
VOH
High Level Output Voltage
IOH = -40µA
VDD -0.3
V
IOL = 1 mA, VDD = +5V
0.4
V
VOL
Low Level Output Voltage
IOL = 0.4 mA, VDD = +3V
0.4
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC + 1V.


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Numéro de composants électroniques

No de pièceDescriptionHtml ViewFabricant
CAT524_07 Quad Digitally Programmable Potentiometer DPP™ with 256 Taps and Microwire Interface 1  2  3  4  5  More Catalyst Semiconductor
CAT523_07 Dual Digitally Programmable Potentiometer DPP™ with 256 Taps and Microwire Interface 1  2  3  4  5  More Catalyst Semiconductor
CAT5401_07 Quad Digitally Programmable Potentiometers DPP™ with 64 Taps and SPI Interface 1  2  3  4  5  More Catalyst Semiconductor
CAT5269_07 Dual Digitally Programmable Potentiometers DPP™ with 256 Taps and 2-wire Interface 1  2  3  4  5  More Catalyst Semiconductor
CAT5419_07 Dual Digitally Programmable Potentiometers DPP™ with 64 Taps and 2-wire Interface 1  2  3  4  5  More Catalyst Semiconductor
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CAT5411_07 Dual Digitally Programmable Potentiometers DPP TM with 64 Taps and SPI Interface 1  2  3  4  5  More Catalyst Semiconductor
CAT5111_07 100-Tap Digitally Programmable Potentiometer DPP™ with Buffered Wiper 1  2  3  4  5  More Catalyst Semiconductor
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