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74AUP1G08GF Fiches technique(PDF) 11 Page - NXP Semiconductors |
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74AUP1G08GF Fiches technique(HTML) 11 Page - NXP Semiconductors |
11 / 17 page 74AUP1G08_2 © Koninklijke Philips Electronics N.V. 2006. All rights reserved. Product data sheet Rev. 02 — 29 June 2006 11 of 17 Philips Semiconductors 74AUP1G08 Low-power 2-input AND gate [1] For measuring enable and disable times RL =5kΩ, for measuring propagation delays, setup and hold times and pulse width RL =1MΩ. Test data is given in Table 11. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 8. Load circuitry for switching times 001aac521 PULSE GENERATOR DUT RT VI VO VEXT VCC RL 5 k Ω CL Table 11. Test data Supply voltage Load VEXT VCC CL RL [1] tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k Ω or 1 MΩ open GND 2 × VCC |
Numéro de pièce similaire - 74AUP1G08GF |
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Description similaire - 74AUP1G08GF |
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