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CAT5401 Fiches technique(PDF) 5 Page - Catalyst Semiconductor

No de pièce CAT5401
Description  Quad Digitally Programmable Potentiometers (DPP™) with 64 Taps and SPI Interface
Download  15 Pages
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Fabricant  CATALYST [Catalyst Semiconductor]
Site Internet  http://www.catalyst-semiconductor.com
Logo CATALYST - Catalyst Semiconductor

CAT5401 Fiches technique(HTML) 5 Page - Catalyst Semiconductor

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CAT5401
© Catalyst Semiconductor, Inc.
5
Doc. No. MD-2012 Rev. G
Characteristics subject to change without notice
D.C. OPERATING CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
Parameter
Test Conditions
Min
Max
Units
ICC
Power Supply Current
fSCL = 2MHz, SO = Open
Inputs = GND
1
mA
ISB
Standby Current (VCC = 5.0V)
VIN = GND or VCC, SO = Open
5
µA
ILI
Input Leakage Current
VIN = GND to VCC
10
µA
ILO
Output Leakage Current
VOUT = GND to VCC
10
µA
VIL
Input Low Voltage
-1
VCC x 0.3
V
VIH
Input High Voltage
VCC x 0.7
VCC + 1.0
V
VOL1
Output Low Voltage (VCC = 3.0V) IOL = 3 mA
0.4
V
PIN
Capacitance
(1)
Available over recommended operating range from TA = 25ºC, f = 1.0MHz, VCC = 5V (unless otherwise noted).
Symbol
Test
Conditions
Max.
Units
COUT
Input/Output Capacitance (SDA)
VOUT = 0V
8
pF
CIN
Input Capacitance (A0, A1, A2, A3, SCL, WP
¯¯¯)
VIN = 0V
6
pF
A.C. CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
tSU
Data Setup Time
50
ns
tH
Data Hold Time
50
ns
tWH
SCK High Time
125
ns
tWL
SCK Low Time
125
ns
fSCK
Clock Frequency
DC
3
MHz
tLZ
HOLD
¯¯¯¯¯ to Output Low Z
50
ns
tRI(
1)
Input Rise Time
2
µs
tFI
(1)
Input Fall Time
2
µs
tHD
HOLD
¯¯¯¯¯ Setup Time
100
ns
tCD
HOLD
¯¯¯¯¯ Hold Time
100
ns
tWC
Write Cycle Time
10
ms
tV
Output Valid from Clock Low
250
ns
tHO
Output Hold Time
0
ns
tDIS
Output Disable Time
250
ns
tHZ
HOLD
¯¯¯¯¯ to Output High Z
100
ns
tCS
CS
¯¯¯ High Time
250
ns
tCSS
CS
¯¯¯ Setup Time
250
ns
tCSH
CS
¯¯¯ Hold Time
CL = 50pF
250
ns
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.


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