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CAT24WC03LE-1.8TE13 Fiches technique(PDF) 2 Page - Catalyst Semiconductor |
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CAT24WC03LE-1.8TE13 Fiches technique(HTML) 2 Page - Catalyst Semiconductor |
2 / 14 page Discontinued Parts CAT24WC03/05 2 Doc. No. 1005, Rev. F © 2005 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55 °C to +125°C Storage Temperature ....................... –65 °C to +150°C Voltage on Any Pin with Respect to Ground(1) ........... –2.0V to +VCC + 2.0V VCC with Respect to Ground ............... –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25 °C) .................................. 1.0W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(2) ........................ 100mA *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +5.5V, unless otherwise specified. Limits Symbol Parameter Min Typ Max Units Test Conditions ICC Power Supply Current 3 mA fSCL = 100 kHz IS(5) Standby Current (VCC = 5.0V) 0 µAVIN = GND or VCC ILI Input Leakage Current 10 µAVIN = GND to VCC ILO Output Leakage Current 10 µAVOUT = GND to VCC VIL Input Low Voltage –1 VCC x 0.3 V VIH Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage (VCC = 3.0V) 0.4 V IOL = 3 mA VOL2 Output Low Voltage (VCC = 1.8V) 0.5 V IOL = 1.5 mA Note: (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns. (2) Output shorted for no more than one second. No more than one output shorted at a time. (3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and JEDEC test methods. (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V. (5) Standby Current (ISB) = 0µA (<900nA). CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V Symbol Test Max Units Conditions CI/O(3) Input/Output Capacitance (SDA) 8 pF VI/O = 0V CIN(3) Input Capacitance (A0, A1, A2, SCL, WP) 6 pF VIN = 0V RELIABILITY CHARACTERISTICS Symbol Parameter Min. Max. Units NEND(3) Endurance 1,000,000 Cycles/Byte TDR(3) Data Retention 100 Years VZAP(3) ESD Susceptibility 2000 Volts ILTH(3)(4) Latch-up 100 mA |
Numéro de pièce similaire - CAT24WC03LE-1.8TE13 |
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Description similaire - CAT24WC03LE-1.8TE13 |
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