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TSA5059TS Fiches technique(PDF) 10 Page - NXP Semiconductors |
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TSA5059TS Fiches technique(HTML) 10 Page - NXP Semiconductors |
10 / 24 page 1999 Oct 05 10 Philips Semiconductors Preliminary specification 2.7 GHz I2C-bus controlled low phase noise frequency synthesizer TSA5059 XT/COMP frequency output It is possible to output either the crystal or the comparison frequency at this pin to be used in the application, for example to drive a second PLL synthesizer, saving a quartz crystal in the bill of material. To output fxtal, it is necessary to set bit XCE to logic 1 and bit XCS to logic 0, or bit XCE to logic 0 and bit XCS to logic 1 during a test mode, while to output fcomp, it is necessary to set both bits XCE and XCS to logic 1. If the output signal at this pin is not used, it is recommended to disable it, setting both bits XCE and XCS to logic 0. Table 10 shows how this pin is programmed. At power-on, the XT/COMP output is set, with the fxtal signal selected. Prescaler enable Even if the TSA5059 is able to work with the relation fcomp = step size for an input frequency up to 2.7 GHz, this IC is designed to be backward compatible with existing ICs for which this relation is only valid for an RF frequency up to 2.0 GHz and in which it is necessary to select a fixed divide-by-two prescaler for frequencies between 2.0 and 2.7 GHz. The prescaler is selected by setting bit PE to logic 1 and it is not in use if bit PE is set to logic 0. For new designs, and especially if it is important to reach a low phase noise on the controlled VCO, it is recommended to set bit PE to logic 0, and not to use the prescaler, allowing the comparison frequency to be equal to the step size, whatever the RF frequency is between 64 and 2700 MHz. Test modes It is possible to access the test modes setting bit XCE to logic 0 and bit XCS to logic 1. One specific test mode is then selected using bits T2, T1 and T0, as described in Table 10. Table 10 XT/COMP and test mode selection; note 1 Notes 1. X = don’t care. 2. Status at Power-on reset. XCE XCS T2 T1 T0 XT/COMP OUTPUT TEST MODE 0 0 X X X disabled normal operation 1 0 XXX fxtal normal operation 1 1 XXX fcomp normal operation 01000 fxtal test operation: charge pump sink; status byte: bit FL = 1 01001 fxtal test operation: charge pump source; status byte: bit FL = 0 01010 fxtal test operation: charge pump disabled; status byte: bit FL = 0 01011 fxtal test operation: 1 ⁄2fDIV switched to Port P0 011 X X fxtal test operation: tuning voltage (pin VT) is off (high-impedance); note 2 |
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