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MC100EL29 Fiches technique(PDF) 2 Page - ON Semiconductor

No de pièce MC100EL29
Description  5V ECL Dual Differential Data and Clock D Flip?묯lop With Set and Reset
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Fabricant  ONSEMI [ON Semiconductor]
Site Internet  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC100EL29 Fiches technique(HTML) 2 Page - ON Semiconductor

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MC100EL29
http://onsemi.com
2
VBB
Figure 1. Logic Diagram and Pinout: 20-Lead SOIC (Top View)
CLK0
D1 CLK1
17
18
16
15
14
13
12
4
3
5678
9
Q0
11
10
Q0
S0
S1
VCC Q1
Q1
VEE
D0
19
20
2
1
R0
VCC
CLK0
D1
D0
CLK1 R1
CLK
D
S
R
Q
Q
CLK
D
R
S
Q
Q
* All VCC pins are tied together on the die.
Warning: All VCC and VEE pins must be externally connected
to Power Supply to guarantee proper operation.
Table 1. PIN DESCRIPTION
PIN
FUNCTION
D0, D0; D1, D1
R0−R1
CLK0, CLK0; CLK1, CLK1
S0−S1
Q0, Q0; Q1, Q1
VBB
VCC
VEE
ECL Differential Data Inputs
ECL Reset Inputs
ECL Differential Clock Inputs
ECL Set Inputs
ECL Differential Data Outputs
Reference Voltage Output
Positive Supply
Negative Supply
Table 2. TRUTH TABLE
R*
S*
D*
CLK*
Q
Q
L
L
H
L
H
L
L
L
H
H
L
H
X
X
X
Z
Z
X
X
X
L
H
L
H
Undef
H
L
H
L
Undef
Z = LOW to HIGH Transition
* Pins will default LOW when left open.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE = 0 V
8
V
VEE
NECL Mode Power Supply
VCC = 0 V
−8
V
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
VEE = 0 V
VCC = 0 V
VI  VCC
VI  VEE
6
−6
V
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
IBB
VBB Sink/Source
± 0.5
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
SOIC−20
SOIC−20
90
60
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
SOIC−20
30 to 35
°C/W
Tsol
Wave Solder
Pb
Pb−Free
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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