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LM317M Fiches technique(PDF) 3 Page - ON Semiconductor

No de pièce LM317M
Description  500 mA Adjustable Output, Positive Voltage Regulator
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Fabricant  ONSEMI [ON Semiconductor]
Site Internet  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

LM317M Fiches technique(HTML) 3 Page - ON Semiconductor

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LM317M
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ELECTRICAL CHARACTERISTICS (VI − VO = 5.0 V; IO = 0.1 A, TJ = Tlow to Thigh (Note 6), unless otherwise noted.)
Characteristics
Figure
Symbol
LM317MA / LM317MAB
Unit
Min
Typ
Max
Line Regulation (Note 7) (TA = 25°C, 3.0 V ≤ VI − VO ≤ 40 V)
3
Regline
0.01
0.04
%/V
Load Regulation (Note 7)
TA = 25°C, 10 mA ≤ IO ≤ 0.5 A
VO ≤ 5.0 V
VO ≥ 5.0 V
4
Regload
5.0
0.1
25
0.5
mV
% VO
Adjustment Pin Current
5
IAdj
50
100
mA
Adjustment Pin Current Change
2.5 V
≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax
3, 4
DIAdj
0.2
5.0
mA
Reference Voltage
3.0 V
≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax
5
Vref
1.225
1.250
1.275
V
Line Regulation (Note 7)
3.0 V
≤ VI−VO ≤ 40 V
3
Regline
0.02
0.07
%/V
Load Regulation (Note 7)
10 mA
≤ IO ≤ 0.5 A
VO ≤ 5.0 V
VO ≥ 5.0 V
4
Regload
20
0.3
70
1.5
mV
% VO
Temperature Stability (Tlow ≤ TJ ≤ Thigh)
5
TS
0.7
% VO
Minimum Load Current to Maintain Regulation (VI − VO = 40 V)
5
ILmin
3.5
10
mA
Maximum Output Current
VI − VO ≤ 15 V, PD ≤ Pmax
VI − VO = 40 V, PD ≤ Pmax, TA = 25°C
5
Imax
0.5
0.15
0.9
0.25
A
RMS Noise, % of VO (TA = 25°C, 10 Hz ≤ f ≤ 10 kHz)
N
% VO
Ripple Rejection, VO = 10 V, f = 120 Hz (Note 8)
Without CAdj
CAdj = 10 mF
6
RR
66
65
80
dB
Long−Term Stability, TJ = Thigh (Note 9)
TA= 25°C for End−point Measurements
5
S
0.3
1.0
%/1.0
kHrs.
6. Tlow to Thigh = 0° to +125°C for LM317MA
Tlow to Thigh = − 40° to +125°C for LM317MAB.
7. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
8. CAdj, when used, is connected between the adjustment pin and ground.
9. Since Long−Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average
stability from lot−to−lot.


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