Moteur de recherche de fiches techniques de composants électroniques
  French  ▼
ALLDATASHEET.FR

X  

SN74ABT18502PMR Fiches technique(PDF) 4 Page - Texas Instruments

Click here to check the latest version.
No de pièce SN74ABT18502PMR
Description  SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
Download  30 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT18502PMR Fiches technique(HTML) 4 Page - Texas Instruments

  SN74ABT18502PMR Datasheet HTML 1Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 2Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 3Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 4Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 5Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 6Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 7Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 8Page - Texas Instruments SN74ABT18502PMR Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 4 / 30 page
background image
SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 – FEBRUARY 2002
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
PIN NAME
DESCRIPTION
GND
Ground
TCK
Test clock. One of four pins required by IEEE Std 1149.1-1990. Test operations of the device are synchronous to the test
clock. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four pins required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through the
instruction register (IR) or selected data register (DR). An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four pins required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data through
the IR or selected DR.
TMS
Test mode select. One of four pins required by IEEE Std 1149.1-1990. The TMS input directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
1A1–1A9,
2A1– 2A9
Normal-function A-bus I/O ports (see function table for normal-mode logic)
1B1–1B9,
2B1– 2B9
Normal-function B-bus I/O ports (see function table for normal-mode logic)
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
Normal-function clock inputs (see function table for normal-mode logic)
1LEAB, 1LEBA,
2LEAB, 2LEBA
Normal-function latch enables (see function table for normal-mode logic)
1OEAB, 1OEBA,
2OEAB, 2OEBA
Normal-function output enables (see function table for normal-mode logic)


Numéro de pièce similaire - SN74ABT18502PMR

FabricantNo de pièceFiches techniqueDescription
logo
Texas Instruments
SN74ABT18502PM TI-SN74ABT18502PM Datasheet
384Kb / 28P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
More results

Description similaire - SN74ABT18502PMR

FabricantNo de pièceFiches techniqueDescription
logo
Texas Instruments
SN54ABT18502 TI-SN54ABT18502 Datasheet
409Kb / 29P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18502 TI1-SN54ABT18502_14 Datasheet
487Kb / 32P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN74ABT18502 TI-SN74ABT18502 Datasheet
384Kb / 28P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18245 TI1-SN54ABT18245 Datasheet
435Kb / 30P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A Datasheet
357Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A_06 Datasheet
436Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A_08 Datasheet
617Kb / 34P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54LVT18502 TI1-SN54LVT18502_08 Datasheet
504Kb / 31P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVT18502 TI-SN54LVT18502 Datasheet
405Kb / 29P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABT8952 TI-SN54ABT8952 Datasheet
365Kb / 24P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30


Fiches technique Télécharger

Go To PDF Page


Lien URL




Politique de confidentialité
ALLDATASHEET.FR
ALLDATASHEET vous a-t-il été utile ?  [ DONATE ] 

À propos de Alldatasheet   |   Publicité   |   Contactez-nous   |   Politique de confidentialité   |   Echange de liens   |   Fabricants
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com