HCF4012B datasheet(3/7 Pages) STMICROELECTRONICS

No de pièce	HCF4012B

Description	DUAL 4 INPUT NAND GATE

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HCF4012B

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DC SPECIFICATIONS

The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V

DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)

(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.

Symbol

Parameter

Test Condition

Value

Unit

VI

(V)

VO

(V)

|IO|

(

µA)

VDD

(V)

TA = 25°C

-40 to 85°C

-55 to 125°C

Min.

Typ.

Max.

Min.

Max.

Min.

Max.

IL

Quiescent Current

0/5

5

0.01

0.25

7.5

µA

0/10

10

0.01

0.5

15

0/15

15

0.01

1

30

0/20

20

0.02

5

150

VOH

High Level Output

Voltage

0/5

<1

5

4.95

V

0/10

<1

10

9.95

0/15

<1

15

14.95

VOL

Low Level Output

Voltage

5/0

<1

5

0.05

V

10/0

<1

10

0.05

15/0

<1

15

0.05

VIH

High Level Input

Voltage

0.5/4.5

<1

5

3.5

V

1/9

<1

10

7

1.5/13.5

<1

15

11

VIL

Low Level Input

Voltage

4.5/0.5

<1

5

1.5

V

9/1

<1

10

3

13.5/1.5

<1

15

4

IOH

Output Drive

Current

0/5

2.5

<1

5

-1.36

-3.2

-1.15

-1.1

mA

0/5

4.6

<1

5

-0.44

-1

-0.36

0/10

9.5

<1

10

-1.1

-2.6

-0.9

0/15

13.5

<1

15

-3.0

-6.8

-2.4

IOL

Output Sink

Current

0/5

0.4

<1

5

0.44

1

0.36

mA

0/10

0.5

<1

10

1.1

2.6

0.9

0/15

1.5

<1

15

3.0

6.8

2.4

II

Input Leakage

Current

0/18

Any Input

18

±10-5 ±0.1

±1

µA

CI

Input Capacitance

Any Input

5

7.5

pF

Symbol

Parameter

Test Condition

Value (*)

Unit

VDD (V)

Min.

Typ.

Max.

tPLH tPHL Propagation Delay Time

5

125

250

ns

10

60

120

15

45

90

tTLH tTHL Output Transition Time

5

100

200

ns

10

50

100

15

40

80

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