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74F243 Fiches technique(PDF) 5 Page - NXP Semiconductors |
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74F243 Fiches technique(HTML) 5 Page - NXP Semiconductors |
5 / 10 page Philips Semiconductors Product specification 74F242/74F243 Transceivers 1990 Aug 30 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VCC = MIN, VIL = MAX IO = 3mA ±10%VCC 2.4 V V High level output voltage VIL = MAX, VIH = MIN IOH = –3mA ±5%VCC 2.7 3.3 V VOH High-level output voltage VCC = MIN, VIL = MAX I = 15mA ±10%VCC 2.0 3.2 V VIL = MAX, VIH = MIN IOL = –15mA ±5%VCC 2.0 3.1 V V Low level output voltage VCC = MIN, VIL = MAX I =MAX ±10%VCC 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOH=MAX ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at A0–A3, B0–B3 VCC = MAX, VI = 5.5V 1 mA II maximum input voltage OEA, OEB VCC = MAX, VI = 7.0V 100 µA IIH High-level input current OEA, OEB VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current only VCC = MAX, VI = 0.5V –1 mA IIH+IOZH Off-state output current High-level voltage applied VCC = MAX, VO = 2.7V 70 µA I +I Off-state output current Low-level voltage 74F242 V = MAX V =0 5V –1.0 mA IIL+IOZL Low-level voltage applied 74F243 VCC = MAX, VO = 0.5V –1.6 mA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICCH 22 35 mA 74F242 ICCL VCC = MAX 40 55 mA ICC Supply current (total) ICCZ 32 45 mA ICC Supply current (total) ICCH 64 80 mA 74F243 ICCL VCC = MAX 64 90 mA ICCZ 71 90 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
Numéro de pièce similaire - 74F243 |
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Description similaire - 74F243 |
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