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Moteur de recherche de fiches techniques de composants électroniques |
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74F166 Fiches technique(PDF) 6 Page - NXP Semiconductors |
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74F166 Fiches technique(HTML) 6 Page - NXP Semiconductors |
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6 / 12 page  Philips Semiconductors Product specification 74F166 8-bit bidirectional universal shift register Feb. 14, 1991 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT CONDITIONS1 MIN TYP2 MAX VOH High–level output voltage VCC = MIN, VIL = MAX, IOH = MAX ±10%V CC 2.5 V VIH = MIN ±5%V CC 2.7 3.4 V VOL Low–level output voltage VCC = MIN, VIL = MAX, IOL = MAX ±10%V CC 0.30 0.50 V VIH = MIN ±5%V CC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK -0.73 -1.2 V II Input current at maximum others VCC = 0.0V, VI = 7.0V 100 µA input voltage CE, CP3 others 20 µA IIH High–level input MR, Ds VCC = MAX, VI = 2.7V 40 µA current Industrial others 40 µA only MR, Ds 80 µA IIL Low–level input current others VCC = MAX, VI = 0.5V -20 µA MR, Ds -40 µA IOS Short–circuit output current4 VCC = MAX -60 -150 mA ICC Supply current (total) VCC = MAX, PE = CE = Dn = GND, MR = Ds = 4.5V, CP = ↑ 50 70 mA Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. When testing CP, CE must remain in high state, whereas CP must remain in high state when testing CE. 4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS Tamb = +25°C Tamb = 0°C to +70 °C Tamb = –40°C to +85°C SYMBOL PARAMETER TEST VCC = +5.0V VCC = +5.0V ± 10% VCC = +5.0V ± 10% UNIT CONDITION CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX MIN MAX fmax Maximum clock frequency Waveform 1 135 175 110 100 ns tPLH tPHL Propagation delay CP to Q7 Waveform 1 5.0 4.0 7.5 6.0 10.0 8.0 5.0 3.5 12.0 9.0 5.0 3.5 13.0 9.0 ns tPHL Propagation delay MR to Q7 Waveform 2 4.0 6.5 8.5 4.0 9.5 4.0 9.5 ns |
Numéro de pièce similaire - 74F166 |
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Description similaire - 74F166 |
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