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STF9NK90Z Fiches technique(PDF) 5 Page - STMicroelectronics |
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STF9NK90Z Fiches technique(HTML) 5 Page - STMicroelectronics |
5 / 16 page STB9NK90Z - STF9NK90Z - STP9NK90Z - STW9NK90Z Electrical characteristics 5/16 Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) tr Turn-on delay time Rise Time VDD=450 V, ID=4A, RG=4.7Ω, VGS=10V (see Figure 20) 22 13 ns ns td(off) tf Turn-off delay time Fall time VDD=450 V, ID=4A, RG=4.7Ω, VGS=10V (see Figure 20) 55 28 ns ns tr(Voff) tf tc Off-voltage Rise Time Fall Time Cross-over Time VDD=720 V, ID=8A, RG=4.7Ω, VGS=10V (see Figure 20) 53 11 22 ns ns ns Table 7. Gate-source zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit BVGSO (1) 1. The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components. Gate-Source Breakdown Voltage Igs=±1mA (Open Drain) 30 V Table 8. Source drain diode Symbol Parameter Test conditions Min Typ. Max Unit ISD Source-drain current 8 A ISDM (1) 1. Pulse width limited by safe operating area Source-drain current (pulsed) 32 A VSD (2) 2. Pulsed: pulse duration=300µs, duty cycle 1.5% Forward on voltage ISD=8A, VGS=0 1.6 V trr Qrr IRRM Reverse recovery time Reverse recovery charge Reverse recovery current ISD=8A, di/dt = 100A/µs, VDD=50V, Tj=150°C 950 10 21 ns µC A |
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Description similaire - STF9NK90Z |
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