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SM2LZ47 Fiches technique(PDF) 2 Page - Toshiba Semiconductor |
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SM2LZ47 Fiches technique(HTML) 2 Page - Toshiba Semiconductor |
2 / 5 page SM2LZ47 2001-07-10 2 ELECTRICAL CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC SYMBOL TEST CONDITION MIN TYP. MAX UNIT Repetitive Peak Off−State Current IDRM VDRM = 800V ― ― 20 µA I T2 (+) , Gate (+) ― ― 1.5 II T2 (+) , Gate (−) ― ― 1.5 Gate Trigger Voltage III VGT VD = 12V, RL = 20Ω T2 (−) , Gate (−) ― ― 1.5 V I T2 (+) , Gate (+) ― ― 10 II T2 (+) , Gate (−) ― ― 10 Gate Trigger Current III IGT VD = 12V, RL = 20Ω T2 (−) , Gate (−) ― ― 10 mA Peak On−State Voltage VTM ITM = 3A ― ― 2.0 V Gate Non−Trigger Voltage VGD VD = 800V, Tc = 125°C 0.2 ― ― V Holding Current IH VD = 12V, ITM = 1A ― ― 10 mA Thermal Resistance Rth (j−a) Junction to Ambient, AC ― ― 58 °C / W Critical Rate of Rise of Off−State Voltage dv / dt VDRM = 800V, Tj = 125°C Exponential Rise ― 500 ― V / µs Critical Rate of Rise of Off−State Voltage at Communication (dv / dt) c VDRM = 400V, Tj = 125°C (di / dt) c = − 0.5A / ms 5 ― ― V / µs MARKING NUMBER SYMBOL MARK *1 Toshiba Product Mark *2 TYPE SM2LZ47 M2LZ47 *3 Example 8A : January 1998 8B : February 1998 8L : December 1998 |
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